JEOL USA Press Releases

24 Hours of Life Science Conference

On June 2, 2021, JEOL will focus on advances in life science research using electron microscopy in its “24 Hours of Life Science” conference. Twenty-four different sessions throughout the full day will cover topics including: - Connectomics and the study of complete volumes of tissues or materials captured at high resolution - Correlative microscopy using light microscopy and scanning electron microscopy to collect large areas of TEM-like data at multiple depths, overcoming the challenge of small ...
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JEOL USA Welcomes New Managing Director, Hidetaka Sawada

April 19, 2021 Peabody, Mass. -- JEOL USA welcomes a new Managing Director, Dr. Hidetaka Sawada, to its Peabody, Massachusetts office this April. Dr. Sawada is a world-renowned expert in aberration corrected electron microscopy. Most recently he served as General Manager of the Technical and Development group in the Electron Microscopy Business Unit of JEOL, Ltd. in Akishima, Japan. Dr. Sawada’s expertise includes the development and installation of the aberration-corrected (Cs) Transmission Electron Microscopes for ...

JEOL Announces 2020 Microscopy Image Grand Prize Winners

January 7, 2021, Peabody, Mass. - JEOL USA awarded two Grand Prizes to winners of its 2020 Electron Microscopy Image Contest, and kicked off its 2021 Image Contest at the beginning of the new year. The annual contest showcases JEOL microscope users’ artistically or esthetically pleasing images with good composition, sharp focus, and technical competency, especially in the use of accelerating voltage. The Grand Prize Transmission Electron Microscope (TEM) Image award was given to Lita ...
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JEOL Begins Remote Demonstrations of New Ultrahigh Resolution Field Emission SEM in July

July 1, 2020 Peabody, Mass. – The launch of a new JEOL Field Emission Scanning Electron Microscope during the summer of 2020 includes virtual demonstrations of its powerful performance directly to those in the market for an analytical ultrahigh resolution SEM. JEOL’s new JSM-IT800 is the company’s top-of-the-line microscope with ultrahigh spatial resolution imaging and analysis at the nanoscale. Capabilities include up to 2,000,000X magnification and an accelerating voltage range of 0.01 to 30kV, making ...

JEOL Introduces New Field Emission SEM with Automated Analytical Intelligence

January 23, 2019 – Peabody, Mass.   JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered optics of the SEM. "JEOL’s F100 FE-SEM offers a truly ...
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JEOL Ltd. Acquires IDES

Acquisition of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. 2020/01/17 JEOL Ltd. (headquartered in Akishima, Tokyo; JEOL hereafter) acquired all shares of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. (headquartered in California, USA; IDES hereafter), an entrepreneurial venture specialized in technologies related to transmission electron microscopy (TEM hereafter), and made IDES its wholly-owned subsidiary. Background and Objective JEOL is driving continuous and sustainable growth by implementing initiatives to accelerate business expansion as outlined in Triangle Plan 2022, its new midterm business plan. ...
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JEOL Establishes OEM Agreement with SpectralWorks, Ltd.

March 19, 2019 - Pittcon 2019 – Philadelphia, PA JEOL USA has established an OEM agreement with SpectralWorks, Ltd. (UK) to distribute AnalyzerPro® software for use with JEOL’s mass spectrometer systems.  AnalyzerPro®’s functions for chromatographic deconvolution, target compound identification, sample-to-sample comparison and chemometric analysis provide powerful tools for examining the data from JEOL’s mass spectrometers, in particular the JEOL AccuTOF-GCx-plus high-resolution time-of-flight GC/MS system.  Example applications of AnalyzerPro® with the AccuTOF-GCX-plus include analysis of coffees ...
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JEOL Announces New High Throughput Analytical Transmission Electron Microscope

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new high throughput analytical electron microscope, JEM-ACE200F, to be released in December 2018.
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High profile forensics cases investigated at Microtrace

Whenever there’s a forensic investigation that requires a closer look with a high-powered electron microscope, chances are the microscope is from JEOL. After being made aware of some of the high profile cases investigated by Microtrace LLC in Illinois using the JEOL Field Emission Scanning Electron Microscope, JEOL spoke with the lab’s forensic scientist. At Microtrace, the company’s father-son team of Skip and Chris Palenik have achieved a kind of celebrity status. But more ...
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Grand Opening for UC Irvine Materials Research Institute and JEOL Center for NanoScale Solutions

(above: IMRI Director Xiaoqing Pan gives opening ceremony speech at UC Irvine Materials Research Institute) (June 22, 2018, Peabody, MA) - When is a Grand Opening truly grand? When the facility and symposium is as impressive as the one at the University of California Irvine Materials Research Institute and the JEOL Center for Nanoscale Solutions. The three-day event kicked off on June 6, 2018 with a welcome from Dr. Xioaqing Pan, Director of the University of California ...