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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT700HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT800
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Soft X-ray Emission Spectrometer
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
MALDI Imaging SpiralTOF
MStation
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
Scanning Electron Microscopes (SEM)
Benchtop
:
NeoScope™
HV/LV Tungsten/LaB6 SEMs
:
IT200
|
IT510
High-Res, Large-Chamber SEM
:
IT700HR
FE SEM
:
JSM-IT800
FE SEM: The New Generation Overview
Sample Preparation Tools
Cross Section Polisher
|
Vacuum Evaporator
|
Smart Coater
|
Carbon Coater
Microprobe (EPMA) and Auger
JXA-iHP200F
|
JXA-iSP100
|
JAMP-9510F
Additive Manufacturing
JAM-5200EBM 3D Printer
Transmission Electron Microscopes (TEM)
120 kV
:
JEM-1400Flash
200 kV
:
NEOARM
|
CRYO ARM™ 200
|
JEM-F200
|
JEM-ACE200F
|
JEM-2100Plus
|
Monochromated ARM200F
300 kV
:
JEM-ARM300F2
|
CRYO ARM™ 300
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
|
JIB-4000PLUS
Medical Equipment
Industrial Equipment
Mass Spectrometers
AccuTOF™ DART®
AccuTOF™ GC-Alpha
AccuTOF™ GCxGC MS
AccuTOF™ LC-Plus
GC/Single-Quadrupole Mass Spectrometer
GC/Triple-Quadrupole Mass Spectrometer
MALDI SpiralTOF™ TOF/TOF
MALDI Imaging SpiralTOF™
MStation
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
Delta NMR Software
CRAFT for Delta
NMR in Pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
|
JES-X320
|
JES-X310
Photomask / Direct Write Lithography
Electron Beam Lithography
APPLICATIONS
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Walkup NMR
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Mass Spectrometry Basics
NMR Basics
NMR Magnet Destruction
Photomask / Direct Write Lithography
Documents & Downloads
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JEOL Periodic Table App
JEOL MS Calculator App
SERVICE / SUPPORT
JEOL USA Service & Support
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