JEOL USA Sample Preparation Tools

JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM.

From Focused Ion Beam (FIB) systems to a benchtop broad ion beam Cross Section Polisher, we offer a selection of specialized instruments to quickly prepare precise cross sections of semiconductor devices, metals, ceramics, multi-layer structures and also environment or beam sensitive materials.

JEOL also offers a line of sputter and evaporative coaters (metal or carbon) that facilitate imaging and analysis of non-conductive samples. These and other peripheral pieces of equipment complement JEOL’s comprehensive line of electron microscopes.


SEM Sample Prep

Cross Section Polisher (CP)

Easy-to-use, sample preparation device for SEM, EPMA, and SAM applications. Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts

Smart Coater

Simple-to-use sputter coater with fully automated vacuum and sputtering

Carbon Coater

Thin film conductive coating for SEM imaging. This simple to use carbon coater features fully automated vacuum and carbon evaporation

TEM and SEM Sample Prep

Vacuum Evaporator

Clean, oil-free, automatic evacuation system for carbon coating of samples

Focused Ion Beam


A multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument.

JIB-4700F Multi Beam System

Combines SEM with FIB column for high-resolution SEM observation and analysis after high-speed cross-section milling with FIB


Focused ion beam processing and observation system (single-beam FIB system) featuring a high-performance ion column


Please see our list of applications specific to Sample Prep.
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