Full-Scale Scanning Electron Microscopes (SEM) – from Macro to Nano

From our most powerful flagship Field Emission SEM with the ultimate resolution, magnification, and analytical flexibility, to our easy-to-use entry level Benchtop SEM, JEOL offers a wide choice of SEMs to suit all applications. 
JEOL introduced its first Scanning Electron Microscope (SEM) in the early 1960s. Since then, JEOL innovations in resolution and SEM functionality have enabled microscopists to image and characterize a new generation of nanomaterials, reveal intricate biological details, analyze forensic evidence, and perform failure analysis and quality control. 
JEOL provides valuable applications support, comprehensive training, and award-winning service for our instruments.
What SEM is right for you? Learn more about each SEM Microscope here, and let JEOL applications experts help you make the right decision.

Instruments:

JEOL USA offers a full SEM product listing for your scientific needs.
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