JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.
JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.
JEOL USA has also developed many unique solutions for SEM applications including:
We offer tailored applications solutions in concert with our partners, including: