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JEOL USA Scanning Electron Microscopes

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.

InTouchScope SEMs

NEW! JSM-IT500HR InTouchScope
Exceptional Fidelity at Any kV
JSM-IT500 InTouchScope
Versatile Research Grade SEM
JSM-IT200 InTouchScope
Seamless Navigation, High Throughput SEM
JSM-IT100 InTouchScope
Versatile Research Grade SEM

Field Emission SEMs

JSM-7900F
Extreme High Resolution FE SEM with Lightning-fast Data Acquisition
JSM-7610FPlus
Ultrahigh Resolution Analytical FE SEM
JSM-7200F
All-In-One High Resolution Analytical FE SEM

Benchtop SEM

MultiBeam FIB/SEMs

Analytical Optimization