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Macro to Nano -- Full Scale Scanning Electron Microscope Solutions

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.

What SEM is right for your applications? Let JEOL applications experts help you make the right decision.


InTouchScope SEMs

Field Emission SEMs

Benchtop SEM

MultiBeam FIB/SEMs

Analytical Optimization