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Macro to Nano -- Full Scale Scanning Electron Microscope Solutions

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.
JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.
What SEM is right for your applications? Let JEOL applications experts help you make the right decision.

Instruments:

InTouchScope™ SEMs

JSM-IT700HR InTouchScope™

Exceptional Fidelity at Any kV

JSM-IT510 InTouchScope™

Versatile Research Grade SEM

JSM-IT200 InTouchScope™

Seamless Navigation, High Throughput SEM

Field Emission SEMs

JSM-IT800

Ultrahigh Resolution FE SEM with the most advanced high-resolution analytical technology available today

JSM-IT700HR

High Resolution, large chamber FE SEM. Compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value

Learn more about our new generation of Field Emission SEMs

Benchtop SEM

NeoScope™ Benchtop SEM

Incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes

MultiBeam FIB/SEMs

JIB-4700F

Used in morphological observations, elemental and crystallographic analyses of a variety of specimens

JIB-4000PLUS

Enables preparation of a thin-film specimen for TEM imaging and a cross-section specimen for observing the interior of the specimen

Analytical Optimization

Soft X-ray Emission Spectrometer

Utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays).
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