PRODUCTS

zoned feldspar

kidney vessel

face cream

shale

chalk

Macro to Nano -- Full Scale Scanning Electron Microscope Solutions

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.
JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.
What SEM is right for your applications? Let JEOL applications experts help you make the right decision.

Instruments:

InTouchScope SEMs

JSM-IT700HR InTouchScope
Exceptional Fidelity at Any kV
JSM-IT510 InTouchScope
Versatile Research Grade SEM
JSM-IT200 InTouchScope
Seamless Navigation, High Throughput SEM

Field Emission SEMs

NEW!
JSM-IT800
Ultrahigh Resolution FE SEM with the most advanced high-resolution analytical technology available today
NEW!
JSM-IT700HR
High Resolution, large chamber FE SEM
Learn more about our new generation of Field Emission SEMs

Benchtop SEM

JCM-7000 NeoScope

MultiBeam FIB/SEMs

JIB-4700FJIB-4000

Analytical Optimization

Soft X-ray Emission Spectrometer
    JEOL USA, Inc.
    11 Dearborn Road
    Peabody, MA 01960
    © Copyright 2022 by JEOL USA, Inc.