zoned feldspar

kidney vessel

face cream

shale

chalk

Full-Scale Scanning Electron Microscopes (SEM) – from Macro to Nano

From our most powerful flagship Field Emission SEM with the ultimate resolution, magnification, and analytical flexibility, to our easy-to-use entry level Benchtop SEM, JEOL offers a wide choice of SEMs to suit all applications. 
JEOL introduced its first Scanning Electron Microscope (SEM) in the early 1960s. Since then, JEOL innovations in resolution and SEM functionality have enabled microscopists to image and characterize a new generation of nanomaterials, reveal intricate biological details, analyze forensic evidence, and perform failure analysis and quality control. 
JEOL provides valuable applications support, comprehensive training, and award-winning service for our instruments.
What SEM is right for you? Learn more about each SEM Microscope here, and let JEOL applications experts help you make the right decision.

Instruments:

InTouchScope™ SEMs

JSM-IT700HR InTouchScope™

Exceptional Fidelity at Any kV

JSM-IT510 InTouchScope™

Versatile Research Grade SEM

JSM-IT200 InTouchScope™

Seamless Navigation, High Throughput SEM

Field Emission SEMs

JSM-IT800

Ultrahigh Resolution FE SEM with the most advanced high-resolution analytical technology available today

JSM-IT700HR

High Resolution, large chamber FE SEM. Compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value

Learn more about our new generation of Field Emission SEMs

Benchtop SEM

NeoScope™ Benchtop SEM

Incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes

MultiBeam FIB/SEMs

JIB-4700F

Used in morphological observations, elemental and crystallographic analyses of a variety of specimens

JIB-4000PLUS

Enables preparation of a thin-film specimen for TEM imaging and a cross-section specimen for observing the interior of the specimen

Analytical Optimization

Soft X-ray Emission Spectrometer

Utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays).

Applications:

Please see our list of applications specific to Scanning Electron Microscopy.
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