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JEOL USA Scanning Electron Microscopes

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.

InTouchScope SEMs

NEW! JSM-IT500HR InTouchScope
Exceptional Fidelity at Any kV
JSM-IT500 InTouchScope
Versatile Research Grade SEM
JSM-IT100 InTouchScope
Versatile Research Grade SEM

Field Emission SEMs

Lightning-fast Data Acquisition
Ultrahigh Resolution Analytical FE SEM
Analytical FE SEM for magnetic to neuroscience samples

Benchtop SEM

MultiBeam FIB/SEMs

Analytical Optimization

We offer a wide range of SEM models

JEOL USA has also developed many unique solutions for SEM applications including:

We offer tailored applications solutions in concert with our partners, including:

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