PRODUCTS

• Scanning Electron Microscopes (SEM)
  • HV/LV Tungsten/LaB6 SEMs
  • JSM-IT200
  • JSM-IT510
  • High-Res, Large-Chamber SEM
  • JSM-IT700HR
  • Benchtop
  • NeoScope Benchtop SEM
  • FE SEM
  • JSM-IT800
  • SEM-FIB
  • JIB-4700F / MultiBeam
  • JIB-4000 / MultiBeam
  • Soft X-ray Emission Spectrometer
• Transmission Electron Microscopes (TEM)
  • 120 kV
  • JEM-1400Flash
  • 200 kV
  • NEOARM
  • Monochromated ARM200F
  • JEM-F200 F2
  • JEM-2100Plus
  • CRYO ARM™ 200
  • JEM-ACE200F
  • 300 kV
  • JEM-ARM300F2
  • CRYO ARM™ 300 II
  • Analytical & Data Optimization
  • JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
  • Environmental Control Solutions
• Focused Ion Beam
  • JIB-4700F
  • JIB-4000PLUS
• Sample Preparation Tools
  • Cross Section Polisher
  • Vacuum Evaporator
  • Smart Coater
  • Carbon Coater
• Nuclear Magnetic Resonance
  • JNM-ECZL series FT NMR
  • Probes
  • ROYALPROBE
  • ROYALPROBE HFX
  • Cryogenic Probes for NMR
  • Liquids/Solution State Probes
  • AutoMAS Solids Probe
  • HCN MAS and HXY NMR Probes
  • Solid State NMR Probes
  • NMR Probe Key Features and Applications
  • Delta NMR Software
  • CRAFT for Delta
  • NMR in pharma
  • qNMR
  • Magnets
  • Sample Changers
• Electron Spin Resonance
  • JES-X330
  • JES-X320
  • JES-X310
• Mass Spectrometers
  • AccuTOF DART
  • AccuTOF DART Technology
  • AccuTOF DART Ionization Mechanisms
  • AccuTOF Time-of-Flight Mass Analyzer
  • AccuTOF DART High-Resolution Accurate Mass
  • AccuTOF GC-Alpha
  • msFineAnalysis
  • AccuTOF GCxGC MS
  • AccuTOF LC-Express
  • GC/Single-Quadrupole Mass Spectrometer
  • NETZSCH And JEOL
  • msFineAnalysis iQ
  • GC/Triple-Quadrupole Mass Spectrometer
  • msFineAnalysis iQ
  • MALDI SpiralTOF TOF/TOF
  • MALDI Imaging SpiralTOF
  • UltraFOCUS DIOXIN Analysis
• Microprobe (EPMA) and Auger
  • JXA-iHP200F
  • JXA-iSP100
  • JAMP-9510F
  • Soft X-Ray Emission Spectrometers
• Photomask / Direct Write Lithography
  • Electron Beam Lithography
  • JBX-9500FS
  • JBX-8100FS
  • JBX-3050MV
• Elemental Analysis
  • Soft X-ray Emission Spectrometer
  • ElementEye JSX-1000S XRF
  • Gather-X Windowless EDS
• Correlative Microscopy Solutions
• Additive Manufacturing 3D Printer
• Medical Equipment
  • BioMajesty Series
  • JCA-6010/C
  • JCA-BM 6050
  • JCA-9130/C
  • JCA-BM 2250
  • JCA-BM 8000 Series
• Industrial Equipment
  • High-Power Electron Beam Sources
  • Electron Beam Sources
  • BS-60050EBS Electron Beam Source
  • EB Source Power Supply
  • Plasma Source
  • Rotary Sensor

APPLICATIONS

• Application List
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  • SEE MORE HERE
• Application List By Product
  • SEM Applications
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• Yokogushi (Cross-Platform Analysis)

FINANCING

RESOURCES

• Electron Optics
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• Analytical Instruments
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• Photomask / Direct Write Lithography
  • Documents & Downloads
• Sample Preparation
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SERVICE / SUPPORT

• JEOL USA Service & Support
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• Offered Services
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NEWS & EVENTS

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• JEOL NEWS Magazine
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BLOG

ABOUT US

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CONTACT US

• JEOL USA Headquarters
• JEOL Regional Web Sites
• Find a Local Sales Rep
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