JEOL USA at Microscopy and Microanalysis (M&M) 2026

UHR Field Emission SEM

JSM-IT810

Ultrahigh resolution FE SEM with the most advanced high-resolution analytical technology available today.

Field Emission SEM

JSM-IT710HR

High resolution, large chamber FE SEM. Compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value.

120kV TEM

JEM-120i

Imaging and cryomicroscopy excellence in a compact and easy to use 120kV TEM.

Benchtop SEM

New NeoScope™

Incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.

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TEM

JEOL-IDES Products

Add time resolution to the TEM's exceptional spatial resolution enabling new applications and the exploration of the dynamics of specimens across a range of very fast time scales.

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Hear from leaders in the field about the latest advancements in microscopy from JEOL.

Lunch & Learns

High-throughput electron diffraction workflows with the XtaLAB Synergy-ED

Jessica E. Burch | Tuesday, August 4 | 12:00 PM - 1:00 PM

Microcrystal electron diffraction has been established as a cutting-edge technique for the structural elucidation of diverse nanocrystalline materials. With thousands of crystallites available on a grid, electron diffraction analysis routinely enables the identification of multiple compounds, crystalline phases, or trace contaminants within a single sample; however, fully automated workflows are critical for its practical implementation in the analysis of complex samples. Herein, we discuss our latest developments in high-throughput data collection and analysis using the XtaLAB Synergy-ED electron diffractometer, developed jointly by JEOL Ltd. and Rigaku Corporation. These developments include AI-driven grain selection and automated energy-dispersive X-ray spectroscopy measurements, seamlessly integrated into CrysAlisPro-ED to improve efficiency and ease of use. Representative examples will be presented to demonstrate these capabilities.

Semiconductor Workflow

Noureddine Anibou | Wednesday, August 5 | 12:00 PM - 1:00 PM

After Hours

MARS

Robert Klie | Monday, August 3 | 5:45 PM - 6:45 PM

Introducing LazEdge: A New Approach to In-Situ Laser Processing in the SEM

Donna Gosselin | Tuesday, August 4 | 5:45 PM - 6:45 PM

Join JEOL USA for an introduction to LazEdge, an integrated laser processing and SEM system designed for rapid cross-sectioning and analysis over large areas. Using a proprietary optical system, LazEdge produces cross sections with minimal laser-induced periodic surface structures (LIPSS), enabling direct SEM observation and EBSD-quality analysis. The integrated workflow allows users to quickly alternate between laser processing and SEM characterization, improving efficiency and throughput. This presentation will provide an overview of the underlying technology and highlight applications in metallurgy, battery, and other materials characterization workflows.

The New CryoARM 300S: Innovations for High-Performance Cryo-Electron Tomography

John Grimes & Irina El Khoury | Wednesday, August 5 | 5:45 PM - 6:45 PM

Demos

The Evolution of Live SEM Analysis—In the form of a Benchtop

Damian Beasock | Tuesday, August 4 | 3:00 PM

Discover how the latest advancements in benchtop SEM technology are changing expectations for imaging and analysis workflows. This live demonstration will showcase powerful real-time analytical capabilities, interactive data collection with real-time data display, and innovative new approaches to sample characterization, highlighting how meaningful microscopy results can be obtained faster and more intuitively than ever before. Join us for a first look at what's next in benchtop SEM analysis.

Taking the Newest JEOL TEM, the JEM-120i, for a Spin

Jaap Brink | Wednesday, August 5 | 3:00 PM

Integrating the JED and EBSD for Simultaneous Elemental and Structural Characterization

Dave Edwards | Wednesday, August 5 | 3:00 PM

Oral Presentations

Development of the 300 kV Magnetic Field-Free Atomic Resolution Electron Microscope

Yuji Kouno

Developments of a Large-Convergence-Angle Scanning Transmission Electron Microscope Operable Over a Wide Range of Accelerating Voltages

Gen Koinuma

Micro-area Analysis Method for Lithium-ion Battery Reaction Products Using SEM with VUV Spectroscopy and VCA Phase Analysis by EDS

Yasuaki Yamamoto

Poster Presentations

Development and Applications of a High-Speed Spectrum Imaging Method in Auger Electron Spectroscopy

Fuyuki Nabeshima

Systematic assessment of quantitative EDS: reproducibility, standardization, limitations and best practices

Kayleigh Harvey | Monday, August 3 | 2:00 PM

Quantitative Microanalysis of Terrestrial and Planetary Samples by Electrons, X-rays, Ions, and Lasers.

Quantitative Microanalysis of Terrestrial and Planetary Samples by Electrons, X-rays, Ions, and Lasers. Peak Shifts and Intensity Changes Due to Structural Changes in the Magnesium and Carbon Systems

Join Us At Microscopy & Microanalysis 2026

AUGUST 2-6, 2026 | BAIRD CENTER, MILWAUKEE, WI

Find JEOL at Booth #504.

ON THE AGENDA

Live Instrument Demos

Lunch & Learn

After-Hours Sessions

Technical Presentations

New NeoScope™

Hear from leaders in the field about the latest advancements in microscopy from JEOL.

High-throughput electron diffraction workflows with the XtaLAB Synergy-ED

Semiconductor Workflow

MARS

Introducing LazEdge: A New Approach to In-Situ Laser Processing in the SEM

The New CryoARM 300S: Innovations for High-Performance Cryo-Electron Tomography

The Evolution of Live SEM Analysis—In the form of a Benchtop

Taking the Newest JEOL TEM, the JEM-120i, for a Spin

Integrating the JED and EBSD for Simultaneous Elemental and Structural Characterization

Development of the 300 kV Magnetic Field-Free Atomic Resolution Electron Microscope

Developments of a Large-Convergence-Angle Scanning Transmission Electron Microscope Operable Over a Wide Range of Accelerating Voltages

Micro-area Analysis Method for Lithium-ion Battery Reaction Products Using SEM with VUV Spectroscopy and VCA Phase Analysis by EDS

Development and Applications of a High-Speed Spectrum Imaging Method in Auger Electron Spectroscopy

Systematic assessment of quantitative EDS: reproducibility, standardization, limitations and best practices

Quantitative Microanalysis of Terrestrial and Planetary Samples by Electrons, X-rays, Ions, and Lasers. Peak Shifts and Intensity Changes Due to Structural Changes in the Magnesium and Carbon Systems

Noureddine Anibou

JEOL USA

Robert Klie

University of Illinois Chicago

John Grimes

JEOL USA

Irina El Khoury

JEOL USA

Damian Beasock

JEOL USA

Jacob "Jaap" Brink

JEOL USA

Kayleigh Harvey

JEOL USA

Dave Edwards

JEOL USA

Yuji Kouno

JEOL Ltd.

Gen Koinuma

JEOL Ltd.

Yasuaki Yamamoto

JEOL Ltd.

Fuyuki Nabeshima

JEOL Ltd.

Souhei Motoki

JEOL Ltd.

Jessica Burch

Rigaku

Peter McSwiggen, Ph.D

McSwiggen Associates / JEOL USA

Register to attend our events at M&M 2026!