We provide the tools that assist in morphological (surface) and compositional characterization of battery materials without any air exposure. JEOL offers special holders and specimen loading devices that allow seamless transition between a sample preparation device such as a cross-section polisher
and an imaging platform (SEM
). Ultra-low voltage imaging combined with signal filtering in the SEM allows direct imaging and analysis of battery constituents (anode and cathode) with nanometer resolution.
Transmission Electron Microscopes
with EELS (electron energy loss spectroscopy) to directly detect Li with chemical state analysis