Application: Additive Manufacturing

Additive Manufacturing (AM) is revolutionizing production across a host of industries from aerospace to medical devices. With decades of expertise in electron optics, JEOL supports the AM community through advanced materials characterization and innovation in 3D printing.
Our JAM-5200EBM electron beam metal AM system reflects our commitment to precision and progress in metal additive manufacturing. JEOL’s scientific instruments enable detailed microstructural analysis from metal powder feedstock to the final printed component ensuring performance, reliability, and quality.

Discover how JEOL empowers the next generation of manufacturing.

SEM/FIB

Particle size and morphology of feedstock and microstructure of the final 3D printed component will have a profound influence on performance and reliability. JEOL has a complete suite of SEMs from benchtop to ultra high-resolution FE SEM and FIB to fit your application and workflow.

Advantages of JEOL SEM and FIB in AM

  • High spatial resolution and large depth of field
  • Correlative analysis with fast navigation
  • Fully embedded EDS for Live Analysis
  • No code automation is built-in for automating imaging and analysis
  • Automated particle analysis
  • Large specimen chamber for nondestructive observation
  • Multiple analytical capabilities – EDS, WDS, EBSD, Tensile testing
  • 3D Imaging, EDS and EBSD with FIB

EPMA

For precise, high-resolution quantitative analysis, EPMA is an ideal technique for characterizing additive manufacturing (AM) materials.

Advantages of JEOL EPMA in AM

  • Higher total probe current deliverable to the sample without sacrificing ultimate resolution
  • Optimized for high throughput analysis with serial analysis, built-in stage and beam scan maps, line scans and more
  • Flexible, customizable configuration of spectrometers and crystals to analyze any element
  • Option to add integrated and embedded UTW-SDD-EDS system and novel SXES detector, both with Live Analysis modes, to maximize versatility
  • Fully dry pumped vacuum system to reduce hydrocarbon contamination

Sample Prep - Broad Ion Beam Milling

Look inside your AM part with broad ion beam milling. Our Cross Section Polishers™ enable the preparation of artifact free cross sections for a perfect view of the microstructure.

Advantages of Cross Section Polisher™ (broad ion beam milling) in AM

  • Creates pristine cross sections for observing voids and fractures
  • Wide area cross sections
  • Ideal prep for EBSD analysis
  • No embedding required
  • Works equally well for hard, soft and brittle materials
  • Easy Set-up and Recipe creation
  • Monitor milling process remotely

TEM

JEOL’s intelligent technology in TEM allows for atomic resolution imaging and analytical characterization at the picometer scale.

Advantages of the JEOL TEM in AM

  • Atomic resolution
  • Structural and defect analysis with bright field and dark field imaging
  • Elemental and crystallographic analysis
  • Chemical and electronic structure analysis
  • Large solid angle EDS
© Copyright 2025 by JEOL USA, Inc.
  • Contact your local Sales Representative to schedule a
    virtual demo now (USA, Canada, Mexico, Brazil)
Terms of Use
|
Privacy Policy
|
Cookie Preferences