JEOL USA Press Releases

JEOL Introduces New Field Emission SEM with Automated Analytical Intelligence

January 23, 2019 – Peabody, Mass.   JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered optics of the SEM. "JEOL’s F100 FE-SEM offers a truly ...
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JEOL Ltd. Acquires IDES

Acquisition of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. 2020/01/17 JEOL Ltd. (headquartered in Akishima, Tokyo; JEOL hereafter) acquired all shares of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. (headquartered in California, USA; IDES hereafter), an entrepreneurial venture specialized in technologies related to transmission electron microscopy (TEM hereafter), and made IDES its wholly-owned subsidiary. Background and Objective JEOL is driving continuous and sustainable growth by implementing initiatives to accelerate business expansion as outlined in Triangle Plan 2022, its new midterm business plan. ...
SpectralWorks, Ltd. OEM agreement

JEOL Establishes OEM Agreement with SpectralWorks, Ltd.

March 19, 2019 - Pittcon 2019 – Philadelphia, PA JEOL USA has established an OEM agreement with SpectralWorks, Ltd. (UK) to distribute AnalyzerPro® software for use with JEOL’s mass spectrometer systems.  AnalyzerPro®’s functions for chromatographic deconvolution, target compound identification, sample-to-sample comparison and chemometric analysis provide powerful tools for examining the data from JEOL’s mass spectrometers, in particular the JEOL AccuTOF-GCx-plus high-resolution time-of-flight GC/MS system.  Example applications of AnalyzerPro® with the AccuTOF-GCX-plus include analysis of coffees ...
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JEOL Announces New High Throughput Analytical Transmission Electron Microscope

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new high throughput analytical electron microscope, JEM-ACE200F, to be released in December 2018.
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High profile forensics cases investigated at Microtrace

Whenever there’s a forensic investigation that requires a closer look with a high-powered electron microscope, chances are the microscope is from JEOL. After being made aware of some of the high profile cases investigated by Microtrace LLC in Illinois using the JEOL Field Emission Scanning Electron Microscope, JEOL spoke with the lab’s forensic scientist. At Microtrace, the company’s father-son team of Skip and Chris Palenik have achieved a kind of celebrity status. But more ...
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Grand Opening for UC Irvine Materials Research Institute and JEOL Center for NanoScale Solutions

(above: IMRI Director Xiaoqing Pan gives opening ceremony speech at UC Irvine Materials Research Institute) (June 22, 2018, Peabody, MA) - When is a Grand Opening truly grand? When the facility and symposium is as impressive as the one at the University of California Irvine Materials Research Institute and the JEOL Center for Nanoscale Solutions. The three-day event kicked off on June 6, 2018 with a welcome from Dr. Xioaqing Pan, Director of the University of California ...
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JEOL’s Food Drive for Haven for Hunger Gets Competitive

Six teams with captains wearing hand decorated chefs hats were able to collect 6,111 pounds of food to donate from JEOL to the local food pantry.) November 15, 2017 – Peabody, Mass. ---- The spirit of giving is getting competitive at JEOL USA headquarters in Peabody, Mass. JEOL employees were challenged to a food drive to support Haven from Hunger. Six teams competed for the heaviest donations – filling boxes with food staples that collectively ...

JEOL Founders Recognized with Pittcon Heritage Award

March 24, 2016 Peabody, MA -- JEOL is honored to announce that the company founders were recognized for their scientific vision and pioneering leadership at Pittcon 2016 in Atlanta, Georgia. President and CEO of the Chemical Heritage Foundation, Carsten Reinhardt, presented the Pittcon Heritage Award to JEOL Ltd. President Gon-emon Kurihara at a special ceremony on Sunday, March 6. President and CEO of the Chemical Heritage Foundation, Carsten Reinhardt (left), presented the Pittcon Heritage Award ...

JEOL Demonstrates New Analytical Technology at Pittcon 2016

March 7, 2016 (Pittcon 2016, Atlanta GA) -- JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Georgia. With a comprehensive line of time-of-flight mass spectrometers, high resolution scanning (SEM) and transmission (TEM) electron microscopes, and the latest in 2-channel and digital/high frequency Nuclear Magnetic Resonance Spectrometry, JEOL helps advance imaging and analytical capabilities across a wide range of scientific research. Real-time gas analysis with InfiTOF JEOL will debut the ...

JEOL Unveils 4th Generation GCxGC Mass Spectrometer with Powerful Data Analysis Software at Pittcon 2015

March 9, 2015 Peabody, MA -- The JEOL AccuTOF-GCx will be exhibited for the first time in the U.S. at Pittcon 2015 in New Orleans, booth #1523. The AccuTOF-GCx, the fourth generation of JEOL’s successful gas chromatography/time-of-flight mass spectrometer systems, is designed for optimum throughput, operation, and uptime. It offers improved resolution, accuracy, and sensitivity, while retaining the power and flexibility of the previous models. In combination with comprehensive 2D gas chromatography (GCxGC) using ...
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