JEOL USA Press Releases

Take Your Best Shot! JEOL Launches SEM/TEM Image Contest

March 6, Peabody, Mass. -- JEOL USA has launched an imaging contest to showcase some of the best work of users of its electron microscopes. A winning image will be selected for each month of 2014, judged by JEOL's SEM and TEM applications teams for their technical and artistic qualities. "Many customers have asked us about launching an image contest, so we decided to do just that starting this year. JEOL SEM and TEM users ...

JEOL Demonstrates New JEM-1400Plus 120kV Transmission Electron Microscope for High Contrast, CryoTEM, and S/TEM Applications

August 5, 2013 (M&M 2013, Indianapolis, Indiana) -- JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8. Based on the popular JEM-1400, the new TEM is making its debut in the United States at the annual meeting of the Microscopy Society of America. JEOL and Protochips have combined efforts to showcase the new TEM technology with the Aduro thermal sample ...

JEOL Unveils New High Throughput, Automated TEM for Nano-analysis

July 12, 2011 (Peabody, Mass.) -- A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss Spectroscopy (EELS) for chemical analysis; critical dimension analysis; tomography; and in situ observation of samples. The ...

JEOL "Flash & Go"™ Speeds Operation of ARM200F Cold FEG Transmission Electron Microscope

JEOL's atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, sets a new standard for rapidly resuming operation after flashing, a routine procedure conducted with any TEM featuring a Cold FEG source. Long considered a tradeoff for the higher resolution, higher brightness, and smaller energy spread of a cold FEG TEM, emission stability degrades due to residual gases in the area of the tip. With conventional cold FEG TEMs, the operator must flash every few ...

New Koch Institute for Integrative Cancer Research at MIT Selects JEOL Transmission Electron Microscope

October 25, 2010 (Peabody, Mass.) -- JEOL USA announced today that the new David H. Koch Institute for Integrative Cancer Research, opening in November at the Massachusetts Institute of Technology (MIT), has selected the JEOL JEM-2100F Transmission Electron Microscope for its new microscopy core. The 200kV Field Emission TEM offers a highly flexible platform for both biological and materials applications. It features rapid data acquisition with uncompromised resolution and analytical performance. This latest generation ...

National Government Standards Lab Selects JEOL Atomic Resolution Microscope for R&D

September 20, 2010 (Peabody, MA) -- JEOL announces a major order for the company's atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory, Boulder, Colorado. "We are very excited to be partnering with this premier Federal ...

Emory University Orders Two JEOL Cryo-TEMs for Expanding the Electron Microscopy Core

August 31, 2010 (Peabody, Mass.) -- JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other at 200kV, will be used in Life and Soft Materials Sciences research. As such, the instruments are equipped for imaging ...

USC Selects JEOL for New Center of Excellence

November 5, 2007 (Peabody, Mass.) -- JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university's Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL MultiBeam, the JIB-4500, a high-performance SEM and micromilling FIB with LaB6 source. The MultiBeam will be housed in new laboratory ...
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