JEOL USA Press Releases

JEOL Exhibits InTouchScope SEM and Cross Section Polishing Abilities at Ceramics Expo

(April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27. From surface observation to cross-section imaging and analysis, JEOL Scanning Electron Microscopes and ion beam polishers reveal structural and elemental details to ensure the quality and composition of materials. JEOL instruments make it possible to examine the inner structure and core ...

Big Picture Plus Analysis from a Small, Compact, and Versatile Benchtop SEM - The JSM-6000PLUS NeoScope from JEOL

March 7, 2016 (Pittcon 2016, Atlanta, Georgia) --- JEOL introduces a new benchtop SEM at Pittcon 2016: the JSM-6000Plus, the third generation of the popular NeoScope. The NeoScope delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs. The JSM-6000Plus model offers high sensitivity backscatter electron detection with a JEOL BSE detector to detect contrast between areas of the sample with different chemical compositions. JEOL's benchtop SEM makes it possible to bring ...

JEOL Tungsten SEM with Smart Analytical Port Geometry Demonstrated at Pittcon 2016

March 7, 2016 (Pittcon 2016 Atlanta, GA) -- JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A highly-customizable SEM, the JSM-IT300LV features smart analytical port geometry for multiple configurations allowing simultaneous analysis techniques. It can be outfitted for 10 or more analytical attachments including: energy dispersive ...

NEW Versatile High Throughput SEM from JEOL

Portland, OR - November 4, 2015 -- JEOL's new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes. Representing 50 years of industry leadership with advances in SEM, the IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design. Featuring expanded EDS analysis capabilities and ports for multiple detectors, the InTouchScope is a versatile workhorse SEM that can be configured to meet individual lab requirements at an exceptional value. ...

Get the big picture from a small, compact, and versatile Benchtop SEM

Introducing the JCM-6000PLUS NeoScope from JEOL JEOL USA, Peabody, MA (October 6, 2015) --- JEOL's benchtop SEM makes it possible to bring basic high resolution imaging and analysis features of a full-sized Scanning Electron Microscope into the lab. It fits into both small spaces and economical budgets, and its simple operation and versatile functions complement the workflow with optical microscopes or larger SEMs. With recent upgrades, JEOL has introduced a new model, the JCM-6000Plus, the third ...

JEOL Introduces New Best-in-Class Field Emission SEM

September 1, 2015, Peabody, MA -- JEOL USA has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope, demonstrated for the first time at M&M 2015 in Portland, Oregon. The new JSM-7200F is a best-in-class FE SEM with ultrahigh spatial resolution of 1.6nm at 1.0kV and high probe current of 300nA. This versatile, user-friendly FE SEM is a compact system designed for easy installation and operation. Featuring through-the-lens detectors that can collect a variety of ...

Pollen Prevails as JEOL Names Spring Image Contest Winners

June 15, 2015, Peabody, MA -- Pollen season 2015 has been one of the worst, but also produced two of the best micrographs that recently won the monthly JEOL Electron Microscope Contest held for the second year in a row. April's winning image of hibiscus pollen grains was submitted by Dr. Howard Berg of Danforth Plant Science in St. Louis, MO, who used the JEOL JSM-6010 InTouchScope Scanning Electron Microscope (SEM) to image the sample ...

JEOL Announces New EDXRF for Wide Range of Sample Types

October 7, 2014 (Peabody, MA) -- JEOL has introduced an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The JSX-1000S ElementEye analyzes major to trace components on most sample types - solids, powders, and liquids - with little or no sample preparation. The ElementEye complements SEM, EPMA, NMR, and mass spectrometry analyses, providing high-sensitivity qualitative and quantitative analysis results in minutes. A Thin Film FP method is optionally available for ...

New JEOL-Nikon MiXcroscopy Correlative Imaging Solution

March 27, 2014 (Peabody, MA) -- JEOL and Nikon have integrated optical microscopy and field emission scanning electron microscopy in a way that enables seamless observation of the same region of interest on a sample with fast, accurate navigation. The technique, MiXcroscopy, employs the same specimen holder for both the optical microscope (OM) and the scanning electron microscope (SEM). The specimen stage registration is fully controlled by dedicated software that allows the OM and ...

Take Your Best Shot! JEOL Launches SEM/TEM Image Contest

March 6, Peabody, Mass. -- JEOL USA has launched an imaging contest to showcase some of the best work of users of its electron microscopes. A winning image will be selected for each month of 2014, judged by JEOL's SEM and TEM applications teams for their technical and artistic qualities. "Many customers have asked us about launching an image contest, so we decided to do just that starting this year. JEOL SEM and TEM users ...
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