JEOL USA Press Releases

August 11, 2009 (Peabody, Mass.) -- JEOL, a leading supplier of high resolution, high performance Scanning Electron Microscopes (SEM) and atomic resolution Transmission Electron Microscopes (TEM), has developed two new publications that explain theory and operation of the SEM for routine imaging and elemental analysis. These two new books can be downloaded from the JEOL USA website (jeolusa.com) under the Resources tab. They are a useful resource for novice users of SEM or anyone teaching ...

May 8, 2009, Peabody, Mass. -- A new e-brochure from JEOL illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples. The online brochure includes SEM images as well as movie and 3D files of complex shale composites and EBSD orientation maps of solar panel thin films. The JEOL cross section polisher produces cross sections without smearing, crumbling, or distortion - ...

“Shaping the technology of tomorrow” is the maxim of the College of Engineering at the University of Texas San Antonio, but shaping the scientists and engineers of the future is the mission of the college’s interactive Technology Experience Center (iTEC). A unique learning center that integrates technology with fun to captivate the interest of young children, iTEC is holding a series of open houses this fall for students ranging from kindergarten to high school age. ...

January 7, 2008 (Peabody, Mass.) -- JEOL USA introduces a new mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed. The new CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the research or manufacturing setting, the CarryScope can be transported between the lab, conference room, or office for inspection of products ...

November 5, 2007 (Peabody, Mass.) -- JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university's Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL MultiBeam, the JIB-4500, a high-performance SEM and micromilling FIB with LaB6 source. The MultiBeam will be housed in new laboratory ...

January 16, 2007, Peabody, MA -- For the first time in its 50+ year history, JEOL USA will be exhibiting at the IPC Printed Circuits Expo/APEX (February 18-22, 2007, Los Angeles, CA). JEOL USA will showcase an argon ion beam cross section polisher (CP) for specimen preparation prior to high magnification imaging with the scanning electron microscope (SEM). The JEOL CP produces precise cross sections of both soft and hard materials, as well as composites. ...