JEOL USA Press Releases

JEOL USA Press Releases


JEOL USA Press Releases

New “CarryScope” Mobile SEM from JEOL

JEOL JCM-5700 CarryScopeJanuary 7, 2008 (Peabody, Mass.) -- JEOL USA introduces a new mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed.

The new CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the research or manufacturing setting, the CarryScope can be transported between the lab, conference room, or office for inspection of products or analysis of research samples.

The JEOL CarryScope delivers several high resolution performance imaging and analytical capabilities of conventional electron microscopes, making it easy to observe high and low magnifications of fine surface structures and digitally record images. Standard features include 8X to 300,000X imaging and up to 5.0nm resolution. The CarryScope produces a sharp image that makes it possible to conduct and annotate high precision measurements on sub-micron structures.

The optional eucentric motorized specimen stage holds a specimen up to 150mm (6 inches) in diameter. Other options include Low Vacuum, EDS compatibility, and multiple live image display, including picture in picture. A Stage Navigation System and SmileShotTM software with smart settings for routine imaging further enhance the capabilities of this small footprint SEM.

photo courtesy of BBC

The new CarryScope will be demonstrated at Pittcon 2008. Visit the JEOL USA booth #4120/4121 for more information. JEOL USA will offer the CarryScope at a special low price effective until March 31, 2008.

Please visit for more information or call 978-535-5900.

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