NeoScopePlus™ Benchtop SEM

JCM-7000Plus
NeoScope™ Benchtop SEM JCM-7000

High-Performance Benchtop SEM for Fast Imaging, Analysis, and Quality Control

The JCM-7000Plus is a high-performance, versatile benchtop scanning electron microscope that combines JEOL’s intelligent automation with advanced imaging and analytical capabilities for fast, reliable results.

From Imaging to Actionable Insight

Capture sample details and analyze features in real time with integrated tools for 3D surface visualization, particle measurement, and optional elemental analysis. Automated workflows help streamline routine observation, materials screening, defect investigation, and quality control.

  • Live 3D surface visualization: Instantly reveals surface structure for faster interpretation.
  • Live particle measurement: Measures particle and feature size in real time.
  • Integrated JEOL EDS option: Supports live elemental analysis and mapping directly within the workflow.
  • Live Map elemental visualization: Displays elemental distribution to help identify defects, contamination, or material variation faster.

Key Features

Easy-to-Use Scanning Electron Microscope for Routine Laboratory Workflows

Move seamlessly from an optical camera image to a live SEM image. Automatic condition settings and advanced auto functions help users capture clear, consistent images with less manual adjustment.
  • Flexible sample compatibility: High- and low-vacuum modes support a wide range of sample types.
  • Imaging detectors: Secondary and multi-segmented backscatter detectors provide insight into morphology and composition.
  • Flexible accelerating voltage selections: 5 to 20 kV supports a variety of analysis needs, with high resolution down to 6 nm and clear visualization of subtle surface structures.
  • Automated image optimization: Advanced auto functions optimize alignment, focus, astigmatism, and brightness.
  • Guided workflows: Recipes help users work efficiently and achieve repeatable results.
  • Large-area imaging and mapping: Montage automation collects and stitches images to create composite images, including large-area elemental maps with the EDS option.
  • Lower ownership burden: A user-replaceable tungsten source enables quick source changes and maximizes uptime.
  • Workflow expansion: No-code automation and Python scripting options support custom workflows.

No Code Automation – NeoAction

No programing required. NeoAction simplifies setup by allowing users to queue multiple measurement areas, define acquisition parameters for SEM imaging and EDS to automatic report generation. Maximize throughput with streamlined unattended operation.

Reliable SEM Results for Materials Analysis, Defect Investigation, and QC

From fast sample navigation to automated image optimization and optional real-time EDS analysis, the JCM-7000Plus helps laboratories streamline observation, analysis, and reporting for efficient, repeatable results.

Application Notes

Videos

Guaranteed resolution with the JEOL NeoScope

Easy Filament Replacement in the JEOL NeoScope

LabTube Meets JEOL NeoScope Benchtop SEM

Seamless navigation with ZeroMag – Plus live EDS analysis

Live 3D imaging for intuitive knowledge of sample surface shape

NeoScope Gallery of Images

Image Gallery

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