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JEOL USA Press Releases

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JEOL Tungsten SEM with Smart Analytical Port Geometry Demonstrated at Pittcon 2016
March 7, 2016 (Pittcon 2016 Atlanta, GA) -- JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A highly-customizable SEM, the JSM-IT300LV features smart analytical port geometry for multiple configurations allowing simultaneous analysis techniques. It can be outfitted for 10 or more analytical attachments including: energy dispersive ...


Researchers first to prove ZIKA Virus associated with Microcephaly Used JEOL Transmission Electron Microscopes (TEM) for imaging brain sections
Scientists from the Institute of Microbiology and Immunology and the Institute of Pathology in Ljubljana, Slovenia are the first in the world to publish and prove that the ZIKA virus is associated with Microcephaly (New England Journal of Medicine, February 10, 2016). ZIKV was found in fetal brain tissue on reversetranscriptase–polymerase-chain-reaction (RT-PCR) assay, with consistent findings on electron microscopy. The complete genome of ZIKV was recovered from the fetal brain. Imaging of the ...


New JEOL "F2" Versatile S/TEM Offers Advanced Analytical Features
(February 3, 2016 -- Peabody, MA) -- JEOL's most recent addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, or "F2," the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. "The combined boost in probe current from the Cold FEG with the dual EDS makes this a fabulous analytical machine," says Dr. Thomas Isabell, Director of the JEOL ...


JEOL USA Announces Grand Prize winners for 2015 SEM & TEM Image Contest
(January 14, 2016 -- Peabody, MA) -- JEOL USA selected two Grand Prize winners from a large collection of customer images submitted to the 2015 Image Contest throughout the calendar year. While one image was selected to win each month, the Grand Prize images exhibited the very best composition and resolution, and demonstrated excellent technical skills with Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). The Grand Prize TEM image was awarded to Prof. ...


NEW Versatile High Throughput SEM from JEOL
Portland, OR - November 4, 2015 -- JEOL's new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes. Representing 50 years of industry leadership with advances in SEM, the IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design. Featuring expanded EDS analysis capabilities and ports for multiple detectors, the InTouchScope is a versatile workhorse SEM that can be configured to meet individual lab requirements at an exceptional value. ...


Get the big picture from a small, compact, and versatile Benchtop SEM
Introducing the JCM-6000PLUS NeoScope from JEOL JEOL USA, Peabody, MA (October 6, 2015) --- JEOL's benchtop SEM makes it possible to bring basic high resolution imaging and analysis features of a full-sized Scanning Electron Microscope into the lab. It fits into both small spaces and economical budgets, and its simple operation and versatile functions complement the workflow with optical microscopes or larger SEMs. With recent upgrades, JEOL has introduced a new model, the JCM-6000Plus, the third ...


JEOL Introduces New Best-in-Class Field Emission SEM
September 1, 2015, Peabody, MA -- JEOL USA has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope, demonstrated for the first time at M&M 2015 in Portland, Oregon. The new JSM-7200F is a best-in-class FE SEM with ultrahigh spatial resolution of 1.6nm at 1.0kV and high probe current of 300nA. This versatile, user-friendly FE SEM is a compact system designed for easy installation and operation. Featuring through-the-lens detectors that can collect a variety of ...


JEOL Brasil Sponsors LNNano Transmission Electron Microscopy Summer School
August 20, 2015 (Peabody, MA and Sao Paulo, Brazil) --- JEOL BRASIL Instrumentos Científicos Ltda. is proud to sponsor the 6th biannual Transmission Electron Microscopy (TEM) Summer School being held at the Brazilian Nanotechnology National Laboratory (LNNano), located in the Brazilian Center for Research in Energy and Materials (CNPEM) campus, Campinas - Brazil. The classroom sessions will be scheduled between January 11 and 29, 2016. Candidates may apply until August 31st. 100 ...


Pollen Prevails as JEOL Names Spring Image Contest Winners
June 15, 2015, Peabody, MA -- Pollen season 2015 has been one of the worst, but also produced two of the best micrographs that recently won the monthly JEOL Electron Microscope Contest held for the second year in a row. April's winning image of hibiscus pollen grains was submitted by Dr. Howard Berg of Danforth Plant Science in St. Louis, MO, who used the JEOL JSM-6010 InTouchScope Scanning Electron Microscope (SEM) to image the sample ...


New JEOL E-Beam Lithography System to Enhance Quantum NanoFab Capabilities
May 5, 2015 - Peabody, MA -- A state-of-the-art JEOL e-beam lithography system will soon be a new resource for quantum information science researchers that utilize the cutting-edge facilities at the University of Waterloo Quantum NanoFab in Waterloo, Ontario. The JEOL JBX-6300FS e-beam system will be used to write circuitry patterns at very high resolution and linewidths as small as 8nm. With accelerating voltage capability to 100kV, high resolution patterns can be written on ...