JEOL USA Press Releases

JEOL Introduces Advanced Techniques for Next-Generation Battery and Energy Materials

JEOL Introduces Advanced Techniques for Next-Generation Battery and Energy Materials at Pittcon 2023

(February 7, 2023 Peabody, Mass.) --  JEOL Electron Microscopes, Nuclear Magnetic Resonance Spectrometers, and Mass Spectrometers are used for research in nearly every scientific discipline including life sciences, materials science, forensics, and drug discovery.  At Pittcon 2023 (March 18-22), JEOL will focus on “The Science of Energy” with specialized imaging and analysis solutions for researchers who are developing battery materials, including Lithium-ion batteries. JEOL technology is also helping researchers to improve petroleum, solar, and ...
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JEOL Introduces New FIB-SEM for Fast, Atomic Resolution STEM Sample Preparation

February 1, 2023 – Peabody, MA JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. High Quality Fast TEM Sample Preparation The new FIB sample stage offers fast transitioning between processing and imaging, allowing for real-time feedback of specimen ...
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National Fish and Wildlife Forensic Mobile Lab Announcement

The JEOL AccuTOF™-DART® 4G mass spectrometer has been chosen as one of the key technologies in a new mobile laboratory developed by the US Fish and Wildlife Service.  The new lab was officially christened on November 3, 2022 at the Clark R. Bavin National Fish and Wildlife Forensics Laboratory in Ashland Oregon.1 The new laboratory, nicknamed “The Woodshed”, was constructed to carry out timber analyses at ports of entry. It will be used to identify ...
Gather-X Windowless EDS from JEOL Answers the Need for Higher Sensitivity and Low-energy X-Ray Detection in SEM

New Gather-X Windowless EDS from JEOL Answers the Need for Higher Sensitivity and Low-energy X-Ray Detection in SEM

August 1, 2022 (M&M 2022 Portland, Oregon) JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest Energy Dispersive Spectrometer (EDS), the Gather-X. This new windowless EDS answers the need for higher sensitivity and low-energy X-Ray detection in the Scanning Electron Microscope (SEM). It can collect the entire EDS range produced from the IT800 series Field Emission SEMs including low-energy X-rays down to Lithium. It is fully ...
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JEOL Leverages 50 Years of E-Beam Expertise to Bring New Metal Additive Manufacturing System to the Americas

(May 2, 2022, Peabody, Mass.) JEOL USA enters a new era of innovation with the introduction of metal additive manufacturing technology into North America backed by an extensive service and support network. JEOL, Ltd. (Tokyo, Japan) has entered the equipment production phase for the JEOL JAM-5200EBM, a new Electron Beam Melting (EBM) powder bed fusion machine that significantly improves productivity, quality, and reliability to produce stronger and lighter parts for a variety of applications. JEOL EBM ...
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Drug Discovery Platform Solutions Using JEOL’s 800 MHz NMR!

NJ Biopharmaceuticals LLC and JEOL Ltd. Are Excited to Announce Their Collaboration to Bring Innovative Drug Discovery Platform Solutions Using JEOL’s 800 MHz NMR! We're excited to share the news that NJ Bio is procuring an 800 MHz NMR spectrometer with a cryogenic probe from JEOL. As part of this collaboration, NJ Bio will contribute its expertise in antibody drug conjugates, oligonucleotide conjugates, and other chemistries to develop platform solutions for its drug discovery clients ...

JEOL Introduces the Next Generation of JEOL NMR Spectrometers: The ECZ Luminous Series

Peabody, MA – JEOL USA is proud to announce the next generation of JEOL NMR spectrometers: the ECZ Luminous series. This product is a next step in spectrometer miniaturization and improving performance through state-of-the-art digital and high-frequency technologies. JEOL USA is a subsidiary of JEOL ltd, a well-respected manufacturer of  cutting-edge scientific equipment with more than 65 years of experience in producing advanced NMR systems.   New ECZL series features MFDS (Multi Frequency Drive System) that ...
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JEOL Introduces New Scanning Electron Microscope with “Simple SEM” Automation and Live Elemental and 3D Analysis

A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control. JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the JSM-IT510. This new Scanning Electron Microscope features productivity enhancing automation, including “Simple SEM” automated imaging, automated montaging (both image and EDS map) ...
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Covalent Metrology and JEOL Announce Partnership, Silicon Valley Demonstration Facility

The two leaders announced a partnership that includes a new JEOL demonstration facility located in Covalent’s Silicon Valley lab. The partnership will accelerate applications development and broaden client access to a suite of state-of-art instrumentation and analytical services. December 07, 2021 – Sunnyvale, CA. Covalent Metrology, a leading North American provider of analytical services, announces its partnership with JEOL a global leader in the development of cutting-edge scientific instruments used in microscopy, analytical chemistry, and ...
atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures

Researchers Achieve Extraordinary Spatial Resolution for In-situ Atomic Resolution TEM Using New Luminary Micro Technique

Materials science researchers in Japan have achieved extraordinary in-situ Transmission Electron Microscope (TEM) experiments using a new Luminary Micro laser technique. They succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures. The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles. This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system ...
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