JEOL USA Press Releases

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JEOL USA Welcomes New Managing Director, Hidetaka Sawada

April 19, 2021 Peabody, Mass. -- JEOL USA welcomes a new Managing Director, Dr. Hidetaka Sawada, to its Peabody, Massachusetts office this April. Dr. Sawada is a world-renowned expert in aberration corrected electron microscopy. Most recently he served as General Manager of the Technical and Development group in the Electron Microscopy Business Unit of JEOL, Ltd. in Akishima, Japan. Dr. Sawada’s expertise includes the development and installation of the aberration-corrected (Cs) Transmission Electron Microscopes for ...

JEOL CANADA Names SOQUELEC as Microscopy Sales Representative in Canada

April 1, 2021 Peabody, Mass -- JEOL, the leading supplier of electron microscopes in North and South America, begins a new partnership on April 1st, 2021 with SOQUELEC LTD., a Montreal, Quebec company with more than 40 years of experience specializing in sales of scientific instruments. SOQUELEC will serve as the sales representative agency for JEOL’s electron microscope product line throughout all of Canada. JEOL will benefit from SOQUELEC’s expanded sales team in the ...
JEOL JMS-T2000GC AccuTOF™ GC-Alpha Mass Spectrometer

JEOL Introduces New Time-of-Flight Mass Spectrometer JMS-T2000GC AccuTOF™ GC-Alpha

February 17, 2021, Peabody, Mass. – JEOL builds upon its legacy of successful AccuTOF™ GC series gas chromatograph – time-of-flight mass spectrometers with the release of the JMS-T2000GC "AccuTOF™ GC-Alpha". This product is a GC-MS that represents significant improvement in performance and functionality using two newly developed key technologies. The basic hardware performance has been greatly improved and a new generation of automated data analysis software is included in the standard configuration. High-Performance Hardware The JMS-T2000GC “AccuTOF™ GC-Alpha”, the ...
Cryo Cross Section Polisher

Pristine Sample Preparation for SEM Using Broad Ion Beam Milling

Feb. 22, 2021 Peabody, Mass. - JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM).  The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation (down to LN2 temperature) and air-isolated transfer for atmosphere sensitive specimens (for example Li batteries). Traditional mechanical preparation of specimen ...

JEOL Announces New Cold Field Emission Cryo-Electron Microscope: CRYO ARM™ 300 II

January 22, 2021 - JEOL Ltd. (President & COO Izumi Oi) announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of “Quick and easy to operate and get high-contrast and high-resolution images”. Product development background Recent dramatic improvement of resolution in single particle analysis (SPA) using cryo-EM has led to SPA as ...

JEOL Announces 2020 Microscopy Image Grand Prize Winners

January 7, 2021, Peabody, Mass. - JEOL USA awarded two Grand Prizes to winners of its 2020 Electron Microscopy Image Contest, and kicked off its 2021 Image Contest at the beginning of the new year. The annual contest showcases JEOL microscope users’ artistically or esthetically pleasing images with good composition, sharp focus, and technical competency, especially in the use of accelerating voltage. The Grand Prize Transmission Electron Microscope (TEM) Image award was given to Lita ...
JEOL JMS-TQ4000GC Triple Quad GC-MS/MS system

Think20 Labs Addressing Regulatory Challenges for Pesticides in Cannabis

(Peabody, Mass. And Irvine, Calif. November 19, 2020) JEOL USA, a leading supplier of mass spectrometers, electron microscopes, and NMR spectrometers, began collaborating with Think20 Labs this year to provide improved and more precise analytical techniques to the Cannabis testing market. Think20 Labs is a start-up company based in California that is licensed by the California Bureau of Cannabis Control to test cannabis, hemp, and cannabis-related consumer products for regulatory requirements. Think20 Lab’s stated goal ...

JEOL Introduces New Compact Field Emission Scanning Electron Microscope

August 3, 2020, Peabody, Mass. JEOL expands its revolutionary FE SEM product group with the introduction of a compact, versatile Field Emission SEM that offers ultrahigh resolution and versatile analytical capabilities at a great value. The new JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded ...

JEOL Begins Remote Demonstrations of New Ultrahigh Resolution Field Emission SEM in July

July 1, 2020 Peabody, Mass. – The launch of a new JEOL Field Emission Scanning Electron Microscope during the summer of 2020 includes virtual demonstrations of its powerful performance directly to those in the market for an analytical ultrahigh resolution SEM. JEOL’s new JSM-IT800 is the company’s top-of-the-line microscope with ultrahigh spatial resolution imaging and analysis at the nanoscale. Capabilities include up to 2,000,000X magnification and an accelerating voltage range of 0.01 to 30kV, making ...

US Department of Homeland Security, Customs and Border Protection, Selects JEOL Mass Spectrometers for Five Labs

May 21, 2020 (Peabody, MA) – JEOL USA announces that it has been awarded a major contract by the US Department of Homeland Security Customs and Border Protection for five JEOL AccuTOF-DART Direct Analysis in Real Time, Time-of-Flight Mass Spectrometers. These instruments will enhance the analytical capabilities of five US Customs and Border Protection laboratories across the country. Three additional labs already installed the AccuTOF-DART in recent years, bringing the total usage to eight ...
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