JEOL USA Press Releases

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JEOL highlights NMR expertise at ENC 2018

PEABODY, MA: 3 May 2018: JEOL, a leading developer and manufacturer of NMR technology, unveiled new NMR probes and NMR software technologies at the 59th Experimental Nuclear Magnetic Resonance Conference (ENC) in Orlando, Florida. As a major sponsor of this year’s conference, JEOL also hosted a technical seminar that included talks by leading researchers from the Osaka University Institute for Protein Research, the Tokyo Institute of Technology School of Life Science & Technology, ABQMR Inc., an ...
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JEOL Announces New Monochromated ARM200F Addition to Atomic Resolution TEM Family

(May 1, 2018 – Peabody, Mass.) With the next generation Monochromated Transmission Electron Microscope, JEOL, a leader in development of electron microscopes for imaging and analysis, introduces the latest technology for cutting edge research in development of new materials. The JEOL Monochromated ARM200F offers ultrahigh energy resolution EELS analysis of materials at the atomic scale, made possible by the development of a unique Spot-in-Spot-out double Wein filter monochromator. The double Wein filter maintains the spot ...
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Grand Opening of UC Irvine Materials Research Institute (IMRI) to Spotlight JEOL Center for Nanoscale Solutions

GRAND ARM Transmission Electron Microscope - JEOL Center for Nanoscale Solutions at California Irvine Materials Research Institute (IMRI) Renowned Materials Scientists to Present at the 1st International Symposium on Advanced Microscopy and Spectroscopy (ISAMS) April 18, 2018 – Peabody, Mass. ---- World-renowned electron microscopists will join Dr. Xiaoqing Pan, Director of the University of California Irvine Materials Research Institute (IMRI), for the Grand Opening of the JEOL Center for Nanoscale Solutions and a three-day symposium June 6-8, ...
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SCMI Consortium chooses JEOL JEM-Z300FSC CRYO ARM™ 300

The Scottish Cryo-EM consortium has chosen the JEOL JEM-Z300FSC CRYO ARM™ 300 as their preferred automated Cryo Transmission Electron Microscope (Cryo-TEM) for the Scottish Centre for Macromolecular Imaging (SCMI). Further information: JEOL UK press release Also See: CRYO ARM™ 200 Field Emission Cryo-electron Microscope CRYO ARM™ 300 Field Emission Cryo-electron Microscope
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JEOL’s Food Drive for Haven for Hunger Gets Competitive

Six teams with captains wearing hand decorated chefs hats were able to collect 6,111 pounds of food to donate from JEOL to the local food pantry.) November 15, 2017 – Peabody, Mass. ---- The spirit of giving is getting competitive at JEOL USA headquarters in Peabody, Mass. JEOL employees were challenged to a food drive to support Haven from Hunger. Six teams competed for the heaviest donations – filling boxes with food staples that collectively ...
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New MALDI Imaging Applications Note

(August 24, 2017 – Peabody, Mass.)  JEOL USA has produced a new MALDI imaging technical applications note that describes the unique analytical process for a variety of biological and organic samples. MALDI imaging is a powerful mass spectrometry technique available with JEOL’s MALDI Imaging SpiralTOF. It is used to assess the distribution of proteins, peptides, lipids, drugs, and metabolites in tissue specimens, as well as compound distribution in organic materials. MALDI is an acronym ...
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JEOL Introduces new IT500HR High Resolution SEM on opening day at M&M 2017

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New Technical Note: Structure Elucidation of Fluorinated Compounds by NMR

August 1, 2017 (Peabody, Mass.) -- A new JEOL technical note, "Structure Elucidation of Fluorinated Compounds by NMR," describes the technology and applications of the new JEOL ROYAL HFX probe for Nuclear Magnetic Resonance (NMR) Spectroscopy. The JEOL ROYAL HFX NMR probe offers a new level of flexibility for NMR analysis of fluorinated compounds prevalent in wide variety of current products and many new products across a wide spectrum of industries. The paper is available for ...

Unique Mass Spectrometer for Analysis of Semiconductor Process Gases

June 15, 2017, Peabody, Mass. -- The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in semiconductor process gases, evolved gases from catalytic reactions, vapor epitaxy and more.  No larger than a desktop PC, the InfiTOF instantly separates isobaric gases such CO and N2, or N2O and CO2, for continuous monitoring without chromatography.  This Time-of-Flight Mass Spectrometer uses Multi-turn and Perfect focusing technologies to achieve high mass-resolving power in ...

JEOL Announces New Field Emission Scanning Electron Microscope

(June 1, 2017 - Peabody, Mass.) – JEOL USA, Inc. introduces its new premier Field Emission SEM, the JSM-7900F, a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis.  This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens. Advanced research and analysis requires ever more powerful capabilities in a flexible, ...
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