JEOL USA Press Releases

JEOL USA Press Releases

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JEOL USA Press Releases

August 20, 2015 (Peabody, MA and Sao Paulo, Brazil) --- JEOL BRASIL Instrumentos Científicos Ltda. is proud to sponsor the 6th biannual Transmission Electron Microscopy (TEM) Summer School being held at the Brazilian Nanotechnology National Laboratory (LNNano), located in the Brazilian Center for Research in Energy and Materials (CNPEM) campus, Campinas - Brazil. The classroom sessions will be scheduled between January 11 and 29, 2016. Candidates may apply until August 31st. 100 ...

June 15, 2015, Peabody, MA -- Pollen season 2015 has been one of the worst, but also produced two of the best micrographs that recently won the monthly JEOL Electron Microscope Contest held for the second year in a row. April's winning image of hibiscus pollen grains was submitted by Dr. Howard Berg of Danforth Plant Science in St. Louis, MO, who used the JEOL JSM-6010 InTouchScope Scanning Electron Microscope (SEM) to image the sample ...

May 5, 2015 - Peabody, MA -- A state-of-the-art JEOL e-beam lithography system will soon be a new resource for quantum information science researchers that utilize the cutting-edge facilities at the University of Waterloo Quantum NanoFab in Waterloo, Ontario. The JEOL JBX-6300FS e-beam system will be used to write circuitry patterns at very high resolution and linewidths as small as 8nm. With accelerating voltage capability to 100kV, high resolution patterns can be written on ...

March 9, 2015 Peabody, MA -- The JEOL AccuTOF-GCx will be exhibited for the first time in the U.S. at Pittcon 2015 in New Orleans, booth #1523. The AccuTOF-GCx, the fourth generation of JEOL’s successful gas chromatography/time-of-flight mass spectrometer systems, is designed for optimum throughput, operation, and uptime. It offers improved resolution, accuracy, and sensitivity, while retaining the power and flexibility of the previous models. In combination with comprehensive 2D gas chromatography (GCxGC) using ...

March 9, 2015 (Pittcon, New Orleans) -- JEOL is proud to celebrate the 10th anniversary of the introduction of the enormously popular AccuTOF-DART® ambient ionization mass spectrometer by introducing the new AccuTOF-DART®4G at Pittcon 2015, with new performance capabilities including enhanced resolution, speed, and accuracy in a rugged, flexible, versatile design. The AccuTOF-DART 4G couples the facile operation of the DART (Direct Analysis in Real Time) ion source with the high-resolution, accurate mass capability of ...

February 19, 2015, Peabody, MA -- With the increased frequency in the use of improvised explosive devices (IEDs), there is a growing need for crime scene investigators to rapidly detect minute traces of explosive materials as well as link the devices to a person of interest. Whenever a latent fingerprint is found at the scene, most analytical techniques would involve use of a swab to take a sample, destroying the fingerprint in the process, ...

(January 13, 2015 -- Peabody, Mass.) JEOL USA and the University of California's Irvine Materials Research Institute (IMRI) have entered into a strategic partnership to create a premier electron microscopy and materials science research facility. The IMRI will serve as an interdisciplinary nexus for the study and development of new materials, enabling advances in solar cell, battery, semiconductor, biological science, and medical technologies.  The IMRI is headed by Dr. Xiaoqing Pan, an internationally-recognized researcher ...

December 15, 2014 (Peabody, MA) -- JEOL USA is pleased to announce a new program that, for a limited time, offers NMR users in the Americas the opportunity to replace their NMR consoles at a special price.  For more than 50 years, JEOL has been known for its legendary support. The company's wide range of NMR solutions are tailored to meet the needs of academic, industrial, and government customers whose applications range from routine experiments ...

October 7, 2014 (Peabody, MA) -- JEOL has introduced an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The JSX-1000S ElementEye analyzes major to trace components on most sample types - solids, powders, and liquids - with little or no sample preparation. The ElementEye complements SEM, EPMA, NMR, and mass spectrometry analyses, providing high-sensitivity qualitative and quantitative analysis results in minutes. A Thin Film FP method is optionally available ...

JEOL Ltd. (President Gon-emon Kurihara) is pleased to announce the development and start of sales of a new atomic resolution electron microscope, JEM-ARM300F. Product development background Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development. However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher ...