Grand Opening of UC Irvine Materials Research Institute (IMRI) to Spotlight JEOL Center for Nanoscale Solutions
GRAND ARM Transmission Electron Microscope - JEOL Center for Nanoscale Solutions at California Irvine Materials Research Institute (IMRI)
Renowned Materials Scientists to Present at the 1st International Symposium on Advanced Microscopy and Spectroscopy (ISAMS)
April 18, 2018 – Peabody, Mass. ---- World-renowned electron microscopists will join Dr. Xiaoqing Pan, Director of the University of California Irvine Materials Research Institute (IMRI), for the Grand Opening of the JEOL Center for Nanoscale Solutions and a three-day symposium June 6-8, ...
SCMI Consortium chooses JEOL JEM-Z300FSC CRYO ARM™ 300
The Scottish Cryo-EM consortium has chosen the JEOL JEM-Z300FSC CRYO ARM™ 300 as their preferred automated Cryo Transmission Electron Microscope (Cryo-TEM) for the Scottish Centre for Macromolecular Imaging (SCMI).
Further information: JEOL UK press release
CRYO ARM™ 200 Field Emission Cryo-electron Microscope
CRYO ARM™ 300 Field Emission Cryo-electron Microscope
JEOL’s Food Drive for Haven for Hunger Gets Competitive
Six teams with captains wearing hand decorated chefs hats were able to collect 6,111 pounds of food to donate from JEOL to the local food pantry.)
November 15, 2017 – Peabody, Mass. ---- The spirit of giving is getting competitive at JEOL USA headquarters in Peabody, Mass. JEOL employees were challenged to a food drive to support Haven from Hunger. Six teams competed for the heaviest donations – filling boxes with food staples that collectively ...
New MALDI Imaging Applications Note
(August 24, 2017 – Peabody, Mass.) JEOL USA has produced a new MALDI imaging technical applications note that describes the unique analytical process for a variety of biological and organic samples. MALDI imaging is a powerful mass spectrometry technique available with JEOL’s MALDI Imaging SpiralTOF. It is used to assess the distribution of proteins, peptides, lipids, drugs, and metabolites in tissue specimens, as well as compound distribution in organic materials. MALDI is an acronym ...
New Technical Note: Structure Elucidation of Fluorinated Compounds by NMR
August 1, 2017 (Peabody, Mass.) -- A new JEOL technical note, "Structure Elucidation of Fluorinated Compounds by NMR," describes the technology and applications of the new JEOL ROYAL HFX probe for Nuclear Magnetic Resonance (NMR) Spectroscopy.
The JEOL ROYAL HFX NMR probe offers a new level of flexibility for NMR analysis of fluorinated compounds prevalent in wide variety of current products and many new products across a wide spectrum of industries.
The paper is available for ...
Unique Mass Spectrometer for Analysis of Semiconductor Process Gases
June 15, 2017, Peabody, Mass. -- The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in semiconductor process gases, evolved gases from catalytic reactions, vapor epitaxy and more. No larger than a desktop PC, the InfiTOF instantly separates isobaric gases such CO and N2, or N2O and CO2, for continuous monitoring without chromatography.
This Time-of-Flight Mass Spectrometer uses Multi-turn and Perfect focusing technologies to achieve high mass-resolving power in ...
JEOL Announces New Field Emission Scanning Electron Microscope
(June 1, 2017 - Peabody, Mass.) – JEOL USA, Inc. introduces its new premier Field Emission SEM, the JSM-7900F, a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis. This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens.
Advanced research and analysis requires ever more powerful capabilities in a flexible, ...
JEOL Introduces World's Fastest Direct Write E-Beam Tool
May 16, 2017 (Peabody, Mass.) -- Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company enters its 51st year in this field with the introduction of a new high throughput spot beam direct write system, the JBX-8100FS.
This new generation of e-beam introduces the capability of writing ultrafine patterns at a high rate of speed directly onto substrates with minimum idle time during the exposure process. ...
New JEOL JSM-IT300HR InTouchScope™ SEM
Ultrahigh resolution imaging of large samples in their native state
May 11, 2017 -- Peabody, MA JEOL USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the JEOL InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter.
Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface ...