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JEOL USA Press Releases

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JEOL Scanning Electron Microscope Offers Versatile Through-the-Lens System for Ultrahigh Resolution
August 25, 2010 (Peabody, Mass.) -- JEOL has introduced a unique Scanning Electron Microscope with optics that enable ultrahigh resolution imaging at low kV and high spatial resolution microanalysis. The Through-the-Lens System (TTLS) combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun. The TTLS is designed to enable imaging of a wide variety of samples, including magnetic materials. The model JSM-7001FTTLS LV also features low vacuum operation and ...


JEOL Correlative Microscope Wins MT-10 Award
August 18, 2010 (Peabody, Mass.) -- The ability to examine biological samples with both electron microscopy and light microscopy using a single instrument and switching between the two with a single mouse click is garnering top honors for the JEOL ClairScope. In August, the editors of Microscopy Today magazine selected the ClairScope for the MT-10 award, which recognizes ten microscopy innovations that make imaging and analysis more powerful, more flexible, more productive, and easier to ...


JEOL AccuTOF-DART Mass Spectrometer Used in Georgia Institute of Technology’s Newly-Developed Ovarian Cancer Test
August 18, 2010 (Peabody, Mass.) -- Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of Technology reported last week that a new test for ovarian cancer was demonstrated to be 99% to 100% accurate over ...


New Cold Field Emission Gun Enhances Ultrahigh Atomic Level Resolution of JEOL ARM200F Aberration-Corrected S/TEM
July 20, 2010 (Peabody, Mass.) -- JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its class. Now outfitted with the optional and field-retrofittable Cold FEG, the ARM200F’s ultrahigh imaging resolution is guaranteed at 78 picometers ...


New JEOL Correlative Microscope Makes U.S. Debut at M&M and Northwestern University after Winning R&D 100 Award
July 13, 2010 (Peabody, Mass.) – This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M) in Portland, Oregon August 2-5, 2010, just prior to installation at Northwestern University’s Biological Imaging Facility where it will ...


Scanning Electron Microscope Reveals “The Scream” in Oil Shale
May 24, 2010 (Peabody, MA) -- Who says science isn’t fun? In their daily work, experienced microscopists at JEOL USA Inc. in Peabody, Massachusetts look at every kind of sample imaginable – paper, neurons in the brain, ceramics, semiconductors, insects, and forensic evidence, to name just a few – through the state-of-the-art scanning electron microscopes (SEMs) that the company manufactures and sells. No matter how long they have been doing this type of work, ...


JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System
May 21, 2010 (Peabody, Mass.) -- JEOL USA announced today the introduction of the company’s first commercially available MALDI-TOF mass spectrometer, the JEOL JMS-S3000 SpiralTOF™. The SpiralTOF reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint, delivering a resolving power of greater than 60,000 (FWHM) over a wide mass range of m/z 10-30,000 - the highest resolving power of all commercial MALDI-TOF systems. JEOL’s patented technology consists of a staggered figure-8 ...


JEOL Offers First Commercially-Available Thin Film Phase Plate Technology for TEM
April 6, 2010, Peabody, Mass. -- The imaging performance of today’s generation of Transmission Electron Microscopes (TEMs) is improved dramatically through the use of a novel technique, the thin film phase plate. JEOL is the only electron microscope supplier to offer commercially-available thin film phase plate technology to its Life Sciences customers, in particular those involved in cryo-electron microscopy and cryo-electron tomography. The phase contrast imaging capability of a phase-plate outfitted JEOL TEM increases specimen ...


Award-winning Pioneer in Nanoscience Research Visits JEOL USA
Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima, who pioneered the use of high resolution transmission electron microscopy (HRTEM) to characterize nanomaterials in the early 70s and successfully imaged carbon nanotubes in the early 90s. Although he has used JEOL TEMs for the past four decades, Dr. Iijima visited JEOL USA this March for the first time following a speaking engagement at MIT’s Center for Materials Science and Engineering. Dr. Iijima’s ...


UT Dallas Re-energizes Semiconductor Nano Research with Acquisition of New JEOL Atomic Resolution Microscope
March 18, 2010, Peabody, Mass. -- JEOL USA and the University of Texas at Dallas (UTD) today jointly announced the University’s acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the atomic level. The announcement was made during a JEOL USA “Nano and Beyond” electron microscopy seminar held in the University’s ...