JEOL USA Press Releases

Take Your Best Shot! JEOL Launches SEM/TEM Image Contest

March 6, Peabody, Mass. -- JEOL USA has launched an imaging contest to showcase some of the best work of users of its electron microscopes. A winning image will be selected for each month of 2014, judged by JEOL's SEM and TEM applications teams for their technical and artistic qualities. "Many customers have asked us about launching an image contest, so we decided to do just that starting this year. JEOL SEM and TEM ...

JEOL Mass Spectrometry News for Pittcon 2014

March 3, 2014 (Pittcon, Chicago, IL) -- The AccuTOF GCV 4G time-of-flight mass spectrometer that JEOL introduced at last year’s PittCon has received great interest from the mass spectrometry community. JEOL USA, Inc. has received several purchase orders from industrial and academic laboratories, with systems already delivered and installed in the US and Canada. In collaboration with JEOL, GC Image LLC and Zoex have continued to enhance the GC Image software to extend the ability ...

High Throughput Serial Block Face Imaging with JEOL FE SEM and Gatan 3View®

December 10, 2013 (Peabody, Mass.) -- JEOL, Ltd., a world leader in electron microscopy, has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes. Researchers will be able to image 3D structures of biological and materials samples at ultrahigh resolution using the JEOL JSM-7100F Field Emission Scanning Electron Microscope with an integrated Gatan 3View® Serial Block Face Imaging ...

New Extended Pressure SEM from JEOL

September 4, 2013 (Peabody, MA) -- JEOL introduces a new Scanning Electron Microscope with expanded pressure range, large specimen chamber, and unsurpassed resolution for imaging and characterizing a wide variety of sample types and sizes. The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten low vacuum SEMs. This all-new design builds upon the award-winning platform of the company's InTouchScope™, analytical SEM with intuitive touch screen control, and the widely used high-performance ...

JEOL Demonstrates New JEM-1400Plus 120kV Transmission Electron Microscope for High Contrast, CryoTEM, and S/TEM Applications

August 5, 2013 (M&M 2013, Indianapolis, Indiana) -- JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8. Based on the popular JEM-1400, the new TEM is making its debut in the United States at the annual meeting of the Microscopy Society of America. JEOL and Protochips have combined efforts to showcase the new TEM technology with the Aduro ...

JEOL and Zoex Partnership Combines Comprehensive Two-Dimensional Gas Chromatography with High Sensitivity Mass Spectrometer

(Peabody, Mass. June 7, 2013) -- JEOL USA, Inc. (Peabody, MA) has concluded an OEM agreement with Zoex Corporation (Houston, TX) to offer the Zoex comprehensive two-dimensional gas chromatography (GC x GC) technology with the new JEOL AccuTOF GCV 4G high-resolution time-of-flight mass spectrometer system.  “We are very excited about the partnership with Zoex. The combination of comprehensive two-dimensional GC with high-resolution, high-sensitivity mass spectrometry is a very powerful platform for the analysis of ...

JEOL Resonance Introduces New Zero Boil Off Magnet for NMR Systems

April 15, 2013 - Pacific Grove, California -- JEOL Resonance (Akishima City, Tokyo) has developed a new Nuclear Magnetic Resonance (NMR) super conducting magnet that operates on a minimum amount of liquid helium. The new NMR system will be announced at the 54th Experimental Nuclear Magnetic Resonance Conference (ENC), the largest NMR conference in the US. JEOL's new NMR system is capable of acquiring high resolution NMR data when liquid helium is scarce. A super ...

Enhanced Analysis and Imaging Capabilities on Display at JEOL Pittcon Booth #2224

March 13, 2013 (Peabody, MA) -- JEOL's latest mass spec instrumentation, NMR technology, and analytical scanning electron microscopes (SEM) will be on display at Pittcon 2013 in Philadelphia, PA, March 18-21 in booth 2224. The new AccuTOF GCv 4G mass spectrometer, the NeoScope Benchtop Scanning Electron Microscope (SEM) and the InTouchScope SEM will be in the booth #2224. Technical experts will be in the booth and also presenting during two key events. JEOL will ...

Maintaining High Mass Resolution for Tissue Imaging with the JEOL SpiralTOF™

October 25, 2012 (Peabody, MA) -- A new application note from JEOL demonstrates that high mass resolving power can be maintained for matrix-assisted laser desorption ionization (MALDI) imaging of biological specimens by using a TOF system with a very long flight path. The JEOL SpiralTOF MALDI TOF/TOF mass spectrometer has unique multi-turn ion optics that pack a 17-meter flight path into a compact 1-meter mass analyzer. The instrument is capable of a resolving power of ...

JEOL High Sensitivity GC-TOF Increases Data Acquisition Speed and Mass Resolving Power

August 3, 2012 (Peabody, Mass.) – JEOL’s newest AccuTOF GCv model - the “4G” - now offers even faster data acquisition rates and higher resolving power than its predecessor. The AccuTOF-GCv|4G has a maximum data acquisition rate of 50 spectra per second and a resolving power of 8000. The 50 Hz acquisition rate now makes it possible to acquire high-resolution mass spectra in combination with third party two-dimensional GC (GC×GC). The AccuTOF-GCv|4G offers the ...