JEOL USA Press Releases

JEOL USA Press Releases

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JEOL USA Press Releases

JEOL's atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, sets a new standard for rapidly resuming operation after flashing, a routine procedure conducted with any TEM featuring a Cold FEG source. Long considered a tradeoff for the higher resolution, higher brightness, and smaller energy spread of a cold FEG TEM, emission stability degrades due to residual gases in the area of the tip. With conventional cold FEG TEMs, the operator must flash every few ...

April 6, 2011 (Peabody, Mass.) -- Effective April 1, 2011, JEOL, Ltd., (Akishima, Japan), a global leader in the design and manufacture of scientific instrumentation, and the Innovation Network Corporation of Japan (INCJ) have formed a new joint venture company dedicated to the development of next-generation NMR instrumentation. The new spinoff, JEOL Resonance, Inc., will allow the flow of technology and expertise beyond the boundaries of existing organizational structures through a new "open innovation" concept. ...

Observation of cells in a water environment at a higher resolution than is possible in optical microscopy

October 25, 2010 (Peabody, Mass.) -- JEOL USA announced today that the new David H. Koch Institute for Integrative Cancer Research, opening in November at the Massachusetts Institute of Technology (MIT), has selected the JEOL JEM-2100F Transmission Electron Microscope for its new microscopy core. The 200kV Field Emission TEM offers a highly flexible platform for both biological and materials applications. It features rapid data acquisition with uncompromised resolution and analytical performance. This latest generation ...

September 21, 2010 (Peabody, Mass.) -- JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic media. The intuitive multi-touch screen interface puts all SEM “Apps” at the operator’s fingertips. The user can expand ...

September 20, 2010 (Peabody, MA) -- JEOL announces a major order for the company's atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory, Boulder, Colorado. "We are very excited to be partnering with this premier Federal ...

August 31, 2010 (Peabody, Mass.) -- JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other at 200kV, will be used in Life and Soft Materials Sciences research. As such, the instruments are equipped for ...

August 25, 2010 (Peabody, Mass.) -- JEOL has introduced a unique Scanning Electron Microscope with optics that enable ultrahigh resolution imaging at low kV and high spatial resolution microanalysis. The Through-the-Lens System (TTLS) combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun. The TTLS is designed to enable imaging of a wide variety of samples, including magnetic materials. The model JSM-7001FTTLS LV also features low vacuum operation and ...

August 18, 2010 (Peabody, Mass.) -- The ability to examine biological samples with both electron microscopy and light microscopy using a single instrument and switching between the two with a single mouse click is garnering top honors for the JEOL ClairScope. In August, the editors of Microscopy Today magazine selected the ClairScope for the MT-10 award, which recognizes ten microscopy innovations that make imaging and analysis more powerful, more flexible, more productive, and easier to ...

August 18, 2010 (Peabody, Mass.) -- Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of Technology reported last week that a new test for ovarian cancer was demonstrated to be 99% to 100% accurate over ...