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JEOL USA Press Releases

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Shale and Solar Thin Film Cross Sectioning Demonstrated in New E-Brochure
May 8, 2009, Peabody, Mass. -- A new e-brochure from JEOL illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples. The online brochure includes SEM images as well as movie and 3D files of complex shale composites and EBSD orientation maps of solar panel thin films. The JEOL cross section polisher produces cross sections without smearing, crumbling, or distortion - ...


Peter Genovese Named President of JEOL USA
Peabody, Mass., April 30, 2009 -- JEOL USA, the leading supplier of electron microscopes and scientific instrumentation to research labs, industry, health and investigative organizations throughout North and South America, announced the promotion of Peter Genovese to the position of President. Mr. Genovese, a member of the JEOL sales organization for more than 25 years, most recently served as Vice President and General Manager of the Sales and Marketing Division of the company. He ...


New JEOL Atomic Resolution Microscope to Aid Advanced Material Research at Florida State University
April 28, 2009 (Peabody, MA) -- For now, scientists at Florida State University (FSU) can only envision what some misoriented atoms are up to along the defects of the new materials that they are developing. They’ll finally be able to clearly see each individual atom and how it relates to its neighbors when they take delivery of a new JEOL atomic resolution Scanning Transmission Electron Microscope (S/TEM) later this year. FSU’s Applied Superconductivity Center, housed ...


JEOL Unveils Highest Resolution 200kV Aberration-corrected Scanning/Transmission Electron Microscope (S/TEM)
Peabody, Mass., March 10, 2009 – The year 2009 marks the introduction of a new generation of Transmission Electron Microscope (TEM) for JEOL, as well as the 60th anniversary of the company with the longest history of innovation and leadership in electron microscopy. JEOL is pleased to introduce the new JEM-ARM200F atomic resolution analytical microscope. Highest Resolution Commercially Available According to JEOL USA, the company’s U.S. subsidiary, JEOL has unveiled its new JEM-ARM200F atomic resolution analytical ...


JEOL USA and the College of Microscopy Increase Collaborative Efforts to Improve Microscopy Education
PITTCON, Chicago, Ill.—JEOL USA, renowned for its expertise as a leading supplier of electron microscopes for research and industrial problem solving, and the College of Microscopy, the education division of The McCrone Group, are proud to announce an increased partnership and joint commitment to improving the study of microscopy. JEOL USA will provide a new JSM-6610LV low vacuum high-performance Scanning Electron Microscope (SEM) to the College of Microscopy for use in basic and advanced training ...


JEOL Introduces Highest Sensitivity GC-TOF Mass Spectrometer
Peabody, Mass., March 6, 2009 -- The new AccuTOF-GCv from JEOL features the highest sensitivity of any GC time-of-flight mass spectrometer commercially available. By combining rapid data acquisition speeds with high resolution and a high dynamic range, the AccuTOF-GCv delivers exact mass measurements for both qualitative and quantitative analysis. The new AccuTOF-GCv introduces several new software features including automatic ion source tuning, automatic drift calibration, automatic data file conversion and export. The Tuning Assistant function ...


JEOL Marks 60th Anniversary at Pittcon 2009
Peabody, Mass., March 5, 2009 -- JEOL, renowned for its role in the development and manufacture of advanced electron microscopy and spectroscopy products since 1949, kicks off its 60th anniversary celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences. Pittcon, also celebrating its 60th anniversary, is known for being the exhibition where companies debut their latest products and technology. JEOL USA will introduce new microscopy and spectrometry instrumentation, as ...


JEOL Produces New Brochure on Instrumentation for Forensic Science
JEOL, renowned for its expertise in the manufacture and applications support of scientific instrumentation for sixty years, has produced a new brochure for 2009 describing electron microscopy and mass spectrometry solutions for forensic science. The brochure includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links to profiles of real case studies involving the use of JEOL Scanning Electron Microscopes (SEM). Demonstrations at American Academy of Forensic ...


New Versatile Tomography Solution for Life Sciences on JEOL Transmission Electron Microscopes
February3, 2009 (Peabody, Mass.) -- JEOL USA is pleased to offer the latest tomography solutions for transmission electron microscopy (TEM). Tomography, or three-dimensional (3D) reconstruction of multiple TEM images, has developed in the past decade as one of the more important applications in the field of life sciences and, more recently, in the field of materials science. Through its applications group, JEOL USA offers support for tomography comprised of three software packages: SerialEM and IMOD, ...


Recent JEOL Sales of E-Beam Tools Includes First-of-its-kind Installation in Pacific Northwest
January 6, 2009 (Peabody, Mass.) -- JEOL USA will install the first e-beam direct-write-on-wafer lithography tool to support nanoscience research in the Pacific Northwest when the University of Washington takes delivery of a JEOL JBX-6300FS e-beam system. The system will be installed in the state-funded Washington Technology Center Microfabrication Lab. Funding for the tool acquisition was provided through a state-supported STAR researchers’ grant to Michael Hochberg, Assistant Professor of Electrical Engineering, and a matching ...