JEOL USA Press Releases

JEOL Offers First Commercially-Available Thin Film Phase Plate Technology for TEM

April 6, 2010, Peabody, Mass. -- The imaging performance of today’s generation of Transmission Electron Microscopes (TEMs) is improved dramatically through the use of a novel technique, the thin film phase plate. JEOL is the only electron microscope supplier to offer commercially-available thin film phase plate technology to its Life Sciences customers, in particular those involved in cryo-electron microscopy and cryo-electron tomography. The phase contrast imaging capability of a phase-plate outfitted JEOL TEM increases specimen ...

Award-winning Pioneer in Nanoscience Research Visits JEOL USA

Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima, who pioneered the use of high resolution transmission electron microscopy (HRTEM) to characterize nanomaterials in the early 70s and successfully imaged carbon nanotubes in the early 90s. Although he has used JEOL TEMs for the past four decades, Dr. Iijima visited JEOL USA this March for the first time following a speaking engagement at MIT’s Center for Materials Science and Engineering. Dr. Iijima’s ...

UT Dallas Re-energizes Semiconductor Nano Research with Acquisition of New JEOL Atomic Resolution Microscope

March 18, 2010, Peabody, Mass. -- JEOL USA and the University of Texas at Dallas (UTD) today jointly announced the University’s acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the atomic level. The announcement was made during a JEOL USA “Nano and Beyond” electron microscopy seminar held in the University’s ...

First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

February 18, 2010 (Peabody, Mass.) -- The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to ...

New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina

February 8, 2010, Peabody, Mass. -- The installation of an advanced imaging tool, a JEOL Electron Probe Microanalyzer (EPMA), will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina. In January, JEOL completed the installation of its new generation of EPMA, also known as a microprobe, at the Southeastern North Carolina Regional Microanalytical and Imaging Center (SENCR-MIC), a state-of-the-art facility opened in 2009 as a joint collaboration between Fayetteville ...

New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance

January 21, 2010, Peabody, Mass. -- JEOL’s award-winning AccuTOF-DART™ mass spectrometer, featuring the new iPod touch-enabled DART SVP ion source, offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology. JEOL introduced the Direct Analysis in Real Time (DART™) ion source in 2005 for its AccuTOF-LC mass spectrometer, expanding the system’s capability with the first commercially-available open air analysis source that produced immediate, accurate mass spectra with ...

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso

December 16, 2009 (Peabody, Mass.) -- The University of Texas El Paso has selected a JEOL cryo-electron microscope for its emerging structural biology program to be housed in a new building planned for completion in 2011 on the UTEP campus. The JEM-3200FS that was ordered from JEOL USA is a 300 keV cryo-TEM with an omega energy filter for increased contrast and high resolution. The UTEP research program directed by structural biologists Dr. Ricardo Bernal ...

JEOL Canada Increases Sales Support for Scientific Instrumentation

December 1, 2009, Peabody, Massachusetts, USA – JEOL, globally-recognized for its advanced Electron Microscopes, Spectrometers, and E-Beam Lithography tools, announces the appointment of a new JEOL Canada Sales Manager. Richard Humphrey of Calgary, Alberta, will represent JEOL throughout all Canadian provinces with the exception of Quebec and Eastern Ontario, which will continue to be represented by Soquelec, Ltd., a JEOL partner since 1981. "I believe JEOL is moving in the right direction to solidify its ...

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere

October 21, 2009, Peabody, Mass. -- JEOL, a global leader in the development and manufacture of scanning and transmission electron microscopes, introduces ClairScope™, a first-of-its kind correlative microscopy tool that combines a high-end Light Microscope (LM) with a high-resolution Atmospheric Scanning Electron Microscope (ASEM). The new JEOL ClairScope enables uncompromised observation of samples in their native state using both LM and ASEM, significantly reducing sample preparation time and allowing dynamic observation of real time ...

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University

With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new discoveries while putting the 200 keV FE TEM with Cs STEM corrector through its paces. High resolution microscopy has fascinated ...
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