JEOL USA Press Releases

JEOL Introduces Multiple Software Enhancements to Advance TEM Imaging and Data Acquisition

July 28, 2008 (Peabody, MA) -- JEOL, the global leader in electron microscopy for nearly 60 years, will demonstrate a variety of new software packages for its 120kV to 300kV series of Transmission Electron Microscopes (TEMs) in booth #1027 at the M&M 2008 Microscopy and Microanalysis exhibit in Albuquerque, New Mexico from August 4-7. Exploring the frontiers of electron microscopy, scientists using JEOL TEMs accelerate research advances and boost productivity with a suite of recently ...

JEOL Debuts New Products at M&M 2008

See the new JEOL lineup: Power Tools for Microscopy and Sample Processing

8 Awards in 8 Years

With a legacy of commitment to customer support, JEOL USA is pleased to accept its 8th award in as many years for excellence in customer satisfaction as judged by our customers. The Omega NorthFace ScoreBoard Award was presented in May at Boston’s World Trade Center to 27 qualifying companies, including JEOL and three other companies that qualified for eight consecutive years. “The NorthFace ScoreBoard Awards recognize organizations who not only offer exemplary customer service, but ...

JEOL Publishes 4th Edition of Applications Notebook for AccuTOF™-DART™ Open Air Mass Spectrometry

May 13, 2008 (Peabody, Mass.) -- JEOL USA has published the fourth edition of its popular collection of applications notes for open air mass spectrometry. The AccuTOF-DART Applications Notebook 4th edition is updated to include several new applications notes covering topics as diverse as real-time analysis of deoxynivalenol in beer to GC/MS using the DART™ ion source. The new book includes 58 pages of real-time analysis of pharmaceuticals, drugs in dose form or in ...

Nikon and JEOL Join Forces to Introduce NeoScope Benchtop SEM

March 3, 2008 (Pittcon 2008, New Orleans, LA) -- Two of the world’s leading imaging equipment suppliers - Nikon Instruments and JEOL - have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana. “The NeoScope partnership is a natural progression for both companies,” said Michael Metzger, General Manager of Sales and Marketing at Nikon Instruments in ...

DART™ Analysis of Aspirin: Correcting a Misapprehension

Introduction In a recently published comparison1 of the ambient ionization techniques direct analysis in real time (DART™ 2) and DESI3, it was reported that a protonated molecule was not observed for DART, whereas the protonated molecule could be observed for DESI and DAPCI. This is an incorrect observation, resulting from the use of different experimental conditions for DART than were used for the other two techniques. Mass spectra of aspirin measured on a JEOL AccuTOF-DART™ ...

Boston College Integrates Nanofabrication with New JEOL Instruments

January 15, 2007 (Peabody, Mass.) -- JEOL USA announced today that Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts. As a result of Boston College’s continued investment in the sciences, the university opened its first clean room (class 1,000/10,000), which will be equipped with the JEOL models JIB-4500 MultiBeam and JSM-7001F Scanning Electron Microscope with ...

New “CarryScope” Mobile SEM from JEOL

January 7, 2008 (Peabody, Mass.) -- JEOL USA introduces a new mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed. The new CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the research or manufacturing setting, the CarryScope can be transported between the lab, conference room, or office for inspection of products ...

New JEOL MultiBeam SEM/FIB for Simultaneous Micro Milling and High Resolution SEM Imaging

November 27, 2007, Peabody, Mass. -- JEOL USA introduces a new high throughput SEM/FIB that combines Focused Ion Beam micro milling with the high resolution imaging of the JEOL LaB6 electron column. The MultiBeam is a high-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair. A versatile all-in-one system, the MultiBeam features Serial Slicing and Sampling (S3™) for in-process monitoring of milling, fabrication, and reconstructing 3D images of ...

USC Selects JEOL for New Center of Excellence

November 5, 2007 (Peabody, Mass.) -- JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university's Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL MultiBeam, the JIB-4500, a high-performance SEM and micromilling FIB with LaB6 source. The MultiBeam will be housed in new laboratory ...
JEOL Ltd. global website
    JEOL USA, Inc.
    11 Dearborn Road
    Peabody, MA 01960
    © Copyright 2023 by JEOL USA, Inc.
    Terms of Use
    Privacy Policy
    Cookie Preferences