New JEOL FE Analytical SEM for HV and LV Operation
March 12, 2007, Peabody, MA — A new thermal field emission analytical SEM from JEOL, the JSM-7001F, acquires high resolution micrographs at up to 1,000,000X for applications ranging from semiconductor, metals, minerals, materials, and ceramics, to non-conductive biological samples.
The JSM-7001F features a unique in lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kV and high current is optimal for characterization ...