JEOL USA Press Releases

Peabody, Mass., June 26, 2006 -- JEOL USA has installed two transmission electron microscopes (TEMs) at the University of Texas Medical Branch’s (UTMB) newly-opened Cryo-electron Microscopy Center for Macromolecular Systems in Galveston, Texas. This facility contains the W. M. Keck Center for Virus Imaging, the first biosafety level 3 (BSL3) laboratory to house a cryo-electron microscope for high-resolution studies of deadly viruses and human pathogens. These research tools will enhance UTMB’s frontline research capabilities in ...

June 2006, Peabody, MA -- For the sixth consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations. Through quarterly surveys of more than 150 JEOL customers, selected randomly, Omega Management Group computed JEOL’s customer satisfaction scores in the categories of technical support, field service, account ...

Peabody, Mass., May 19, 2006 -- JEOL, the leading manufacturer of e-beam lithography tools since 1967, announces the introduction of a new high precision direct write e-beam lithography system. The new JBX-6300FS is a spot beam, vector scan, step and repeat lithography system designed for high volume direct patterning on wafers, and is capable of writing minimum line widths of 8nm. 2-inch to 200mm wafers can be accommodated, as well as parts and pieces. ...

Peabody, Mass., May 19, 2006 --  JEOL, the industry-leading manufacturer of high resolution Scanning Electron Microscopes (SEMs), will showcase its automated, 360 degree wafer edge review SEM in Booth 1101 in the South Hall at Semicon West 2006, Moscone Center, San Francisco. The JEOL JWS-2000 (200mm) and JWS-3000 (200/300mm) are the only wafer edge review SEMs that allow pinpoint inspection at any position on the circumference of the 200mm or 300mm wafer. A unique high ...

Peabody, Mass., May 17, 2006 --  JEOL USA, a leading manufacturer of electron microscopes and analytical instruments, introduces a new ultra-high resolution Field Emission Scanning Electron Microscope (SEM) with advanced optics that clearly reveal intricate surface details during observation of nano structures of medical, biological, materials science, and semiconductor samples. Unique in-lens performance with semi-in lens advantages The performance and stability of the new JSM-7500F allows specimens to be easily observed at magnifications up to ...

Peabody, Mass., April 17, 2006 --  JEOL USA recently demonstrated a revolutionary remote capability for operating a transmission electron microscope (TEM) using a laptop computer with a cellular network connection. While seated at a picnic table 300 miles away, JEOL applications specialists manned the controls of a JEM-2200FS TEM operated at Lehigh University in Pennsylvania. Untethered TEM operation is a unique capability from JEOL made possible with a simple instrument control knobset and laptop computer ...

Peabody, Mass., April 7, 2006 – JEOL USA, a leading supplier of electron microscopes and analytical instruments with annual sales of more than $100 million, has appointed Sales Director Peter Genovese to the position of Vice President. Mr. Genovese has held successive management positions in the sales organization since joining JEOL in 1983. He manages a sales team with regional offices throughout the U.S., Canada, and Mexico as well as South America. JEOL USA, established ...

Peabody, Mass., March 17, 2006 -- A new applications notebook from JEOL USA comprises more than 25 recent applications notes resulting from analyses using the AccuTOF™ DART™ (Direct Analysis in Real Time) mass spectrometer. The broad range of applications in this second volume of notes published since the introduction of DART includes pharmaceuticals, foods, industrial products, forensic evidence, and biological fluids analyzed without sample preparation. Samples are analyzed in open air using the DART ion source, ...

Peabody, Mass., March 9, 2006 -- A new single-column focused ion beam (FIB) system from JEOL makes automated, high-speed specimen preparation affordable at nearly one-third the cost of dual beam FIBs. The JEOL JEM-9320 FIB prepares thin films and cross sections for failure and defect analysis at the nanoscale using S/TEM, TEM or surface observation. An ion beam current of 30nA at 30kV delivers fast, automated precise milling of specimens, which can be observed in ...

Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images (secondary electron, backscattered electron, and digital camera), on-screen measurement, and smart settings for simplified functionality. Secondary electron resolution is 3.0nm ...