PRODUCTS

JEOL USA Press Releases

JEOL USA Press Releases

rss

JEOL USA Press Releases

JEOL DART Mass Spectrometer Ion SourceNovember 28, 2006 (Peabody, Mass.) -- JEOL USA Inc. today announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent No. 7,112,785 by the U.S. Patent and Trademark office. The patent covers the method of ionization of the DART process.

This is the second U.S. patent covering the DART device and technology. The first patent was awarded in September 2005. The award-winning DART was commercially introduced in February 2005 for the JEOL AccuTOF™ time-of-flight mass spectrometer. JEOL has more than 50 DART ion sources in operation today.

"We believe that DART technology will play a significant role in the future of mass spectrometry and are pleased that the U.S. patent office has recognized the unique characteristics of the DART method," said Dr. Robert Cody. Dr. Cody of JEOL USA and Dr. James Laramee, a former consultant - now with SAIC - are co-inventors of the DART.

DART is a unique ion source for mass spectrometry, in that samples are analyzed in open air. No radioactive components, solvent sprays, exposed high voltage, or vacuum are used to alter the sample state.

DART has gained wide acceptance in forensics analysis, homeland security, and pharmaceutical screening, as well as chemical synthesis and environmental applications. DART technology can eliminate or reduce sample preparation and complements existing LC or GC analytical techniques.



Comments are closed.
    JEOL USA, Inc.
    11 Dearborn Road
    Peabody, MA 01960
    © Copyright 2022 by JEOL USA, Inc.
    Terms of Use
    |
    Privacy Policy
    |
    Cookie Preferences