August 23, 2007 (Peabody, Mass.) -- JEOL USA received a distinguished visitor at its Peabody, Massachusetts office on Tuesday, August 21st, when the 2007 Ernst Ruska Prize winner, Professor Hiroshi Jinnai of Kyoto Institute of Technology, visited JEOL’s U.S. headquarters. Dr. Jinnai, an invited speaker at the American Chemical Society Fall conference held in Boston during the week of August 20th, uses a JEOL Transmission Electron Microscope (TEM) in his nanomaterials research at the Kyoto Institute of Technology.
“We are honored Professor Jinnai took time from his busy schedule to visit our office while he was in Boston addressing the ACS conference attendees,” said Bob Santorelli, President and CEO of JEOL USA. “It’s always exciting to meet the scientists who use JEOL instruments to achieve such great strides in research. We were delighted to be able to congratulate him on this very significant award.”
The German Society for Electron Microscopy awarded the biannual Ruska prize jointly to Prof. Hiroshi Jinnai, Prof. Richard J. Spontak, and Prof. Paul A. Midgley for their work on "Novel and Quantitative Uses of Electron Tomography in the 3D Study of Nanostructured Materials." The prize will be presented in Saarbrucken, Germany, at Saarland University in September.
Professor Jinnai’s current research interests include 3D imaging and analysis of block copolymers and nano-composites using Transmission Electron Microtomography, a process which he has developed using the JEOL TEM. He also uses Laser Scanning Confocal Microscopy and X-ray CT to study phase separation process of polymer blends.
Professor Richard J. Spontak is an Alumni Distinguished Professor in Chemical and Biomolecular Engineering and Materials Science and Engineering at North Carolina State University (NCSU). Paul Midgley is Reader in Electron Microscopy at the University of Cambridge.
About the Ernst Ruska Prize
The Ernst Ruska Prize is given in honor of the inventor of the transmission electron microscope. It was a tremendous breakthrough in microscopy when, in 1933, it was found that an image of an object could be produced by using an electron beam. Ruska took the invention to a commercial stage while working for Siemens in Germany. He won the Nobel Prize in Physics in 1986 and many other notable awards throughout his life.
JEOL Leading TEM Manufacturer
Since the invention of the TEM, JEOL has manufactured the high-powered electron microscopes for more than 50 years, developing more powerful TEMs with higher resolution and capabilities for cryo microscopy and 3D modeling of infinitesimally small samples, including viruses and particles of materials. JEOL TEMs are installed in universities, hospitals, and manufacturing facilities throughout the world.
Jinnai Invited to Several Fall Conferences
In addition to hosting sessions at the ACS convention in Boston, Dr. Jinnai is an invited speaker at the eleventh Frontiers of Electron Microscopy in Materials Science (FEMMS) Conference to be held September 23-28, 2007 at the Sonoma DoubleTree Hotel in the Sonoma Wine Country. FEMMs is an international conference focused on the application of electron microscopy in the field of materials science, and its invited speakers are the most influential scientists in the field, attracting the best and brightest of the electron microscopy community and affording significant opportunities for students and post docs to meet and have substantive discussions with the leaders in the field.
Before heading to FEMMS, Dr. Jinnai will speak at a polymer conference in Crete, and he will travel to Germany to receive the Ruska Prize at the 33rd Microscopy Conference organized by the Deutsche Gesellschaft fur Elektronenmikroskop.
Dr. Jinnai uses a JEOL JEM-2200FS TEM at Kyoto Institute of Technology.