JEOL USA Press Releases

New Versatile Tomography Solution for Life Sciences on JEOL Transmission Electron Microscopes

February3, 2009 (Peabody, Mass.) -- JEOL USA is pleased to offer the latest tomography solutions for transmission electron microscopy (TEM). Tomography, or three-dimensional (3D) reconstruction of multiple TEM images, has developed in the past decade as one of the more important applications in the field of life sciences and, more recently, in the field of materials science. Through its applications group, JEOL USA offers support for tomography comprised of three software packages: SerialEM and IMOD, ...

Recent JEOL Sales of E-Beam Tools Includes First-of-its-kind Installation in Pacific Northwest

January 6, 2009 (Peabody, Mass.) -- JEOL USA will install the first e-beam direct-write-on-wafer lithography tool to support nanoscience research in the Pacific Northwest when the University of Washington takes delivery of a JEOL JBX-6300FS e-beam system. The system will be installed in the state-funded Washington Technology Center Microfabrication Lab. Funding for the tool acquisition was provided through a state-supported STAR researchers’ grant to Michael Hochberg, Assistant Professor of Electrical Engineering, and a matching ...

Pioneer in Materials Science and President of Tohoku University Visits JEOL USA

October 28, 2008 – Peabody, Massachusetts – Electron microscope leader JEOL USA hosted a special visit recently from renowned materials scientist Dr. Akihisa Inoue, President of Tohoku University in Sendai, Japan. Dr. Inoue’s research in a new class of bulk amorphous metals has made a major impact on subsequent research into new materials around the world. U.S. Honors Dr. Inoue with Two Awards Dr. Inoue has recently received distinction as one of only nine foreign associates ...

JEOL Demonstrates Rapid Detection of Melamine in Powdered Milk Using Direct Analysis in Real Time (DART)

October 29, 2008 – Peabody, Mass. - First it was pets, now it is babies who have died from ingesting food tainted with melamine. Detection of this chemical compound, which is being maliciously added to food products to make them appear to contain higher levels of protein, takes on a new urgency in a global market. A rapid screening technique that has been widely used for instant analysis without sample preparation has just been proven ...

New David H. Murdock Research Institute Specifies JEOL Cryo-electron Microscopes

Peabody, Mass., October 15, 2008 – Two of JEOL’s top-of-the-line cryo-electron microscopes will be key instrumentation for multi-disciplinary scientific advances in a new $1 billion research center in Kannapolis, North Carolina. The David H. Murdock Research Institute (DHMRI) has selected JEOL’s high resolution electron microscopes for its world-class laboratory, which will serve as a central resource to multiple university research institutes and private companies. The vision and impetus behind this collaborative research institute is that ...

Shaping the Scientists of Tomorrow

“Shaping the technology of tomorrow” is the maxim of the College of Engineering at the University of Texas San Antonio, but shaping the scientists and engineers of the future is the mission of the college’s interactive Technology Experience Center (iTEC). A unique learning center that integrates technology with fun to captivate the interest of young children, iTEC is holding a series of open houses this fall for students ranging from kindergarten to high school age. ...

JEOL to Demonstrate Remote Microscopy at M&M 2008

July 30, 2008 (Peabody, Mass.) -- From the exhibition hall at the 2008 Microscopy and Microanalysis Conference in Albuquerque, New Mexico, JEOL USA will demonstrate – via remote operation – three of its more than 30 JEOL TEMs currently using Sirius™ Remote TEM software and internet or wireless connections. Visitors to the booth will be able to perform real-time operation of the JEM-2200FS Aberration-corrected TEMs at Oak Ridge National Laboratory in Tennessee and Lehigh ...

JEOL Introduces New Thermal FE-SEM at M&M 2008

July 31, 2008 (Peabody, Mass.) -- JEOL USA will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F, at M&M 2008 in Albuquerque, New Mexico in its booth #1027. Featuring the highest beam current available on any FEG SEM, the JSM-7600F integrates a semi-in-lens objective lens with an in-lens thermal electron gun, providing superior imaging of nonconductive samples that traditionally charge, such as photomasks, ceramics, and glass. This ...

JEOL Adds New FE MultiBeam to Its SEM/FIB Lineup

July 30, 2008 (Peabody, Mass.) -- JEOL USA will demonstrate both of its new MultiBeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam “power tools” at M&M 2008. The LaB6 model, the JIB-4500 MultiBeam, was introduced in December 2007 and has already gained wide acceptance, with recent installations at nanotechnology research centers at Boston College and the University of Southern California. A new Field Emission MultiBeam, the model JIB-4600F, will debut ...

JEOL to Hold Tutorial Session for Practical Remote In Situ Microscopy (PRISM) at M&M 2008

July 28, 2008 (Peabody, Mass.) -- JEOL USA will host a tutorial session at M&M 2008 in conjunction with Oak Ridge National Laboratory (ORNL) and Protochips to introduce PRISM – Practical Remote In Situ Microscopy. The PRISM tutorial will be held on Monday, August 4, 2008 at the Microscopy & Microanalysis (M&M) Exhibit in Albuquerque, New Mexico in the JEOL booth #1027 at 5:30 p.m. PRISM is a technique made possible by the remote operation ...
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