JEOL USA Press Releases

JEOL Opens New Office in Brasil

October 3, 2011 (Peabody, Mass.) -- A leading supplier of electron microscopes and scientific instrumentation, JEOL USA (Peabody, Mass.) and its parent company JEOL Ltd. (Akishima, Japan) have opened an office in Sao Paulo, Brasil to support its growing installed base there, and have relocated the personnel to a new facility this month. JEOL has enjoyed a 40-year history in Brasil, with the past 30 being through its agent, Fugiwara Enterprises I.C., Ltda. As the ...

JEOL USA Partners with Chilean Agent Arquimed

September 27, 2011 (Peabody, MA) -- JEOL USA, a leading supplier of scientific and industrial instrumentation including electron microscopes, mass spectrometers and nuclear magnetic resonance spectrometers, and headquartered in Peabody, Massachusetts, has entered an agreement with Arquimed, Ltda. making Arquimed JEOL’s exclusive agent in Chile. Arquimed, located in Santiago, has a 75-year history as one of Chile’s largest and most respected distributors of scientific, medical, educational, and industrial tools and equipment. While JEOL USA has ...

JEOL Unveils New High Throughput, Automated TEM for Nano-analysis

July 12, 2011 (Peabody, Mass.) -- A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss Spectroscopy (EELS) for chemical analysis; critical dimension analysis; tomography; and in situ observation of samples. The ...

New JEOL Large Angle Energy Dispersive Spectrometer (EDS) for Ultrafast Elemental Mapping of S/TEM Samples

July 7, 2011 (Peabody, Mass.) -- JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm2. The larger the solid angle of measurement, the more ...

JEOL Introduces New Environmental Control System for Scientific Instrument Labs

June 30, 2011 (Peabody, MA) -- Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting the room, and the enclosed facility itself can all affect the performance of sensitive instrumentation. To help ensure optimum instrument performance and maintain a consistently cool environment without adding air turbulence, JEOL, a global supplier of ultrahigh resolution electron microscopes, has developed a ...

JEOL InTouchScope Scanning Electron Microscope Wins R&D 100 Award

June 30, 2011 (Peabody, MA) -- The JEOL InTouchScope™ SEM, a touchscreen-controlled analytical, portable low vacuum Scanning Electron Microscope, has been recognized by the editors of R&D Magazine as one of the 100 most technologically significant products introduced into the marketplace over the past year. “This is a significant honor for JEOL because the InTouchScope is the first SEM to combine the convenience of multi-touch screen operation, analytical versatility, and ease of use in a ...

New JEOL Stage Navigation System for SEM and EPMA

May 31, 2011 (Peabody, MA) -- JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification optical microscope. The external camera eliminates the need for a dedicated port on the electron column. The user simply ...

JEOL "Flash & Go"™ Speeds Operation of ARM200F Cold FEG Transmission Electron Microscope

JEOL's atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, sets a new standard for rapidly resuming operation after flashing, a routine procedure conducted with any TEM featuring a Cold FEG source. Long considered a tradeoff for the higher resolution, higher brightness, and smaller energy spread of a cold FEG TEM, emission stability degrades due to residual gases in the area of the tip. With conventional cold FEG TEMs, the operator must flash every few ...

New JEOL Spinoff Company Dedicated to NMR and ESR Scientific Instrumentation

April 6, 2011 (Peabody, Mass.) -- Effective April 1, 2011, JEOL, Ltd., (Akishima, Japan), a global leader in the design and manufacture of scientific instrumentation, and the Innovation Network Corporation of Japan (INCJ) have formed a new joint venture company dedicated to the development of next-generation NMR instrumentation. The new spinoff, JEOL Resonance, Inc., will allow the flow of technology and expertise beyond the boundaries of existing organizational structures through a new "open innovation" concept. ...

Cancer Research using the ClairScope™

Observation of cells in a water environment at a higher resolution than is possible in optical microscopy
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