JEOL USA Press Releases

National Government Standards Lab Selects JEOL Atomic Resolution Microscope for R&D

September 20, 2010 (Peabody, MA) -- JEOL announces a major order for the company's atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory, Boulder, Colorado. "We are very excited to be partnering with this premier Federal ...

Emory University Orders Two JEOL Cryo-TEMs for Expanding the Electron Microscopy Core

August 31, 2010 (Peabody, Mass.) -- JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other at 200kV, will be used in Life and Soft Materials Sciences research. As such, the instruments are equipped for imaging ...

JEOL Scanning Electron Microscope Offers Versatile Through-the-Lens System for Ultrahigh Resolution

August 25, 2010 (Peabody, Mass.) -- JEOL has introduced a unique Scanning Electron Microscope with optics that enable ultrahigh resolution imaging at low kV and high spatial resolution microanalysis. The Through-the-Lens System (TTLS) combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun. The TTLS is designed to enable imaging of a wide variety of samples, including magnetic materials. The model JSM-7001FTTLS LV also features low vacuum operation and ...

JEOL Correlative Microscope Wins MT-10 Award

August 18, 2010 (Peabody, Mass.) -- The ability to examine biological samples with both electron microscopy and light microscopy using a single instrument and switching between the two with a single mouse click is garnering top honors for the JEOL ClairScope. In August, the editors of Microscopy Today magazine selected the ClairScope for the MT-10 award, which recognizes ten microscopy innovations that make imaging and analysis more powerful, more flexible, more productive, and easier to ...

JEOL AccuTOF-DART Mass Spectrometer Used in Georgia Institute of Technology’s Newly-Developed Ovarian Cancer Test

August 18, 2010 (Peabody, Mass.) -- Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of Technology reported last week that a new test for ovarian cancer was demonstrated to be 99% to 100% accurate over ...

New Cold Field Emission Gun Enhances Ultrahigh Atomic Level Resolution of JEOL ARM200F Aberration-Corrected S/TEM

July 20, 2010 (Peabody, Mass.) -- JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its class. Now outfitted with the optional and field-retrofittable Cold FEG, the ARM200F’s ultrahigh imaging resolution is guaranteed at 78 picometers ...

New JEOL Correlative Microscope Makes U.S. Debut at M&M and Northwestern University after Winning R&D 100 Award

July 13, 2010 (Peabody, Mass.) – This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M) in Portland, Oregon August 2-5, 2010, just prior to installation at Northwestern University’s Biological Imaging Facility where it will ...

Scanning Electron Microscope Reveals “The Scream” in Oil Shale

May 24, 2010 (Peabody, MA) -- Who says science isn’t fun? In their daily work, experienced microscopists at JEOL USA Inc. in Peabody, Massachusetts look at every kind of sample imaginable – paper, neurons in the brain, ceramics, semiconductors, insects, and forensic evidence, to name just a few – through the state-of-the-art scanning electron microscopes (SEMs) that the company manufactures and sells. No matter how long they have been doing this type of work, ...

JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System

May 21, 2010 (Peabody, Mass.) -- JEOL USA announced today the introduction of the company’s first commercially available MALDI-TOF mass spectrometer, the JEOL JMS-S3000 SpiralTOF™. The SpiralTOF reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint, delivering a resolving power of greater than 60,000 (FWHM) over a wide mass range of m/z 10-30,000 - the highest resolving power of all commercial MALDI-TOF systems. JEOL’s patented technology consists of a staggered figure-8 ...

JEOL Offers First Commercially-Available Thin Film Phase Plate Technology for TEM

April 6, 2010, Peabody, Mass. -- The imaging performance of today’s generation of Transmission Electron Microscopes (TEMs) is improved dramatically through the use of a novel technique, the thin film phase plate. JEOL is the only electron microscope supplier to offer commercially-available thin film phase plate technology to its Life Sciences customers, in particular those involved in cryo-electron microscopy and cryo-electron tomography. The phase contrast imaging capability of a phase-plate outfitted JEOL TEM increases specimen ...
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