March 13, 2013 (Peabody, MA) -- JEOL's latest mass spec instrumentation, NMR technology, and analytical scanning electron microscopes (SEM) will be on display at Pittcon 2013 in Philadelphia, PA, March 18-21 in booth 2224. The new AccuTOF GCv 4G mass spectrometer, the NeoScope Benchtop Scanning Electron Microscope (SEM) and the InTouchScope SEM will be in the booth #2224. Technical experts will be in the booth and also presenting during two key events.
JEOL will hold a press conference on Monday, March 18th from 10:30-11, Room #103C. The half-hour discussion features speakers Dr. Chip Cody and Mr. David Edwards of JEOL USA. Topics include:
- Introduction of the new AccuTOF GCV 4G time-of-flight mass spectrometer. For the first time, this instrument will be shown in the U.S. and will be paired with the Zoex GCxGC interface used with JEOL’s unique EI/FI ion source. The AccuTOF GCV 4G is the only high-resolution mass spectrometer that combines comprehensive gas chromatography with high-resolution mass spectrometry and a choice of EI, CI and FI ion sources. The JEOL combination EI/FI source offers a powerful and routine alternative to chemical ionization for a wide range of applications.
- Introduction of the new capabilities of the SpiralTOF MALDI-TOF-TOF mass spectrometer, including MALDI imaging and LC/MALDI-MS, including correlative microscopy between the SpiralTOF and JEOL's SEM product line. The SpiralTOF's 17-meter flight path minimizes the effect of topographic variations on samples, such as biological tissues and fingerprints, and maintains high mass-resolving power.
- Open air analysis is no longer a novelty – it has become a must-have technology for mass spectrometry in a multitude of fields. JEOL continues to lead in developing new DART methods and applications for its AccuTOF-DART system.
- The newly redesigned NeoScope benchtop SEM features integrated Energy-dispersive X-ray Spectroscopy (EDS) with SDD technology for advanced analytical applications. The NeoScope offers selectable accelerating voltages and up to 60,000X magnification - all in a simple-to-use, benchtop instrument.
Additionally, JEOL will participate in the Japan Symposium on March 19, Room 122B, from 2:40-3:15 with a presentation by Dr. Thomas Isabell entitled "Aberration Corrected Electron Microscopy: Structure Determination and Chemistry on the Atomic Scale."
Additional talks and poster sessions:
Monday, room 118A: 9:35 (450-5)
DART-MS Collision Induced Dissociation (CID) for Structural Analysis of Synthetic Cannabinoids JASON SHEPARD, University at Albany, SUNY, Rabi Musah, Ashton Lesiak, Marek Domin, Robert B Cody, John Dane
Tuesday, room 1118C: 8:40 (1060-3)
The State-of-the-DART for Forensic Analysis ROBERT B CODY, JEOL USA, Inc.
Tuesday, room 118C 3:15 (1320-3)
Five Years of DART-TOF Forensic Applications ROBERT R STEINER, Virginia Dept of Forensic Science
Tuesday, Room 122B, 2:40 (1280-2)
Aberration Corrected Electron Microscopy: Structure Determination and Chemistry on the Atomic Scale - THOMAS C ISABELL, JEOL USA, Inc.
Tuesday poster (890-8 P)
Rapid Non-Destructive Identification of Magnetic Tape Degradation Products Using Infrared Spectroscopy and DART Mass Spectrometry with Multivariate Statistics - BRIANNA CASSIDY, University of South Carolina, Zhenyu Lu, Stephen Morgan, Eric Breitung, Juan Rodriguez, Samantha Skelton
Zoex GCxGC talk:
Monday 9:55 (490-2) GCxGC Separation of Fatty Acid Methyl-Esters: Using Giddings Dimensionality to Aid the Interpretation of Comprehensive Two-Dimensional Gas Chromatograms - EDWARD B LEDFORD, Zoex Corporation, William Spear, Zhanpin Wu, Pierluigi Delmonte, Ali Reza Fardin-Kia, Jeanne I Rader