JEOL USA Press Releases

JEOL Introduces World's Fastest Direct Write E-Beam Tool

May 16, 2017 (Peabody, Mass.) -- Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company enters its 51st year in this field with the introduction of a new high throughput spot beam direct write system, the JBX-8100FS. This new generation of e-beam introduces the capability of writing ultrafine patterns at a high rate of speed directly onto substrates with minimum idle time during the exposure process. ...

New JEOL JSM-IT300HR InTouchScope™ SEM

Ultrahigh resolution imaging of large samples in their native state May 11, 2017 -- Peabody, MA JEOL USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the JEOL InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter. Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface ...

JEOL RESONANCE and Mestrelab Research S.L., announce technology partnership for qNMR market - qNMR seamless

Tokyo (April 27, 2017) JEOL RESONANCE Inc. (hereafter "JEOL") and Mestrelab Research S.L.(hereafter "Mestrelab") announce a new technology partnership of significant interest to industrial and government institutions that perform work involving compound quantitation using NMR(qNMR). qNMR has been attracting considerable attention across a broad spectrum of chemical analytical laboratories, as it provides accurate quantitative information without the requirement of reference compounds or predetermined response factors for every analyte. qNMR can be applied for the evaluation of ...

New Field Emission Cryo-Electron Microscope JEM-Z200FSC

Tokyo (April 26, 2017) Cryo-electron microscopy has been established as a method to enable observation of cells and biological molecules with no fixation and no staining. Owing to the recent rapid progress of hardware and software, this microscopy technique has become increasingly important as an atomic-scale structural analysis method. In addition, technologies that enable analysis of membrane proteins without crystallization have been developed, resulting in increased use of cryo-electron microscopy for drug discovery. Thus, installation ...

JEOL Exhibits InTouchScope SEM and Cross Section Polishing Abilities at Ceramics Expo

(April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27. From surface observation to cross-section imaging and analysis, JEOL Scanning Electron Microscopes and ion beam polishers reveal structural and elemental details to ensure the quality and composition of materials. JEOL instruments make it possible to examine the inner structure and core ...

New JEOL NMR Probe for Fluorinated Compounds

(March 1, 2017, Peabody, MA) -- With the introduction of the ROYAL HFX probe for Nuclear Magnetic Resonance (NMR) Spectroscopy, JEOL offers a new level of flexibility for NMR analysis of fluorinated compounds prevalent in many new pharmaceutical products.  The ROYAL HFX is the world's first liquid NMR probe with the capability to automatically switch between single tune and dual tune modes on the high frequency coil without compromising single tune performance. The probe can ...

JEOL Highlights New Analytical Technologies at ASMS 2016

June 2, 2016 (Peabody, Mass.) -- JEOL USA will unveil several new analytical technologies during ASMS 2016 in San Antonio, Texas (Booth #229). With a comprehensive line of time-of-flight mass spectrometers, JEOL advances analytical capabilities for a wide range of scientific research. JEOL and the company's mass spectrometry customers will present several posters at ASMS. In particular, one oral presentation by collaborators at University at Albany will detail the use of AccuTOF-DART for "Classification of ...

JEOL Founders Recognized with Pittcon Heritage Award

March 24, 2016 Peabody, MA -- JEOL is honored to announce that the company founders were recognized for their scientific vision and pioneering leadership at Pittcon 2016 in Atlanta, Georgia. President and CEO of the Chemical Heritage Foundation, Carsten Reinhardt, presented the Pittcon Heritage Award to JEOL Ltd. President Gon-emon Kurihara at a special ceremony on Sunday, March 6. President and CEO of the Chemical Heritage Foundation, Carsten Reinhardt (left), presented the Pittcon Heritage Award ...

JEOL Demonstrates New Analytical Technology at Pittcon 2016

March 7, 2016 (Pittcon 2016, Atlanta GA) -- JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Georgia. With a comprehensive line of time-of-flight mass spectrometers, high resolution scanning (SEM) and transmission (TEM) electron microscopes, and the latest in 2-channel and digital/high frequency Nuclear Magnetic Resonance Spectrometry, JEOL helps advance imaging and analytical capabilities across a wide range of scientific research. Real-time gas analysis with InfiTOF JEOL will debut the ...

JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis

March 7, 2016 (Pittcon 2016, Atlanta, GA) -- At Pittcon 2016 (booth #2857), JEOL will debut the new InfiTOF, a compact high-resolution mass spectrometer designed for real-time gas analysis. The InfiTOF’s unique multi-turn ion optics provide high-resolution mass spectra in a system that is the size of a personal computer tower. Featuring a mass resolving power of up to 30,000, the InfiTOF can easily separate isobaric species such as CO+ and N¬2+ without chromatography. ...
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