JEOL Introduces New Best-in-Class Field Emission SEM
September 1, 2015, Peabody, MA -- JEOL USA has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope, demonstrated for the first time at M&M 2015 in Portland, Oregon.
The new JSM-7200F is a best-in-class FE SEM with ultrahigh spatial resolution of 1.6nm at 1.0kV and high probe current of 300nA. This versatile, user-friendly FE SEM is a compact system designed for easy installation and operation.
Featuring through-the-lens detectors that can collect a variety of ...