JEOL NEWS Magazine

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    - Fast Pixelated Detectors: A New Era for STEM
    - Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
    - Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
    - Electronic State Analysis by Monochromated STEM-EELS
    - Chemical State Analyses by Soft X-ray Emission Spectroscopy
    - X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
    - Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
    - Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
    - Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
    - Development of the JBX-8100FS Electron Beam Lithography System

JEOL NEWS Magazine (previous issues)


  • Vol. 42 No. 1, July 2007 Vol. 42 No. 1, July 2007
    Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging; Improvement of Reflection Electron Microscopy: LODREM; Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM; A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water; High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates; Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images; New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates; Auger Analyses Using Low Angle Incident Electrons; Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS); Introduction of New Products;
  • Vol. 41 No. 1, July 2006 Vol. 41 No. 1, July 2006
    The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications; Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science; Visualization of Biological Nano-Machines at Subnanometer Resolutions; Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases; Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth; Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System; Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry; Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy;
  • Vol. 40 No. 1, July 2005 Vol. 40 No. 1, July 2005
    Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples; Direct Analysis in Real Time (DART™) Mass Spectrometry; High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects; Recent Development of TEM for Advanced Ceramics; Advanced Analysis Technology Supporting SiP; FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution; 100 Sample Auto Sample Changer and Tubeless NMR; Windows Delta; Latest Information and Future for ALICE2 Software); Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"; Development of Ion Slicer (Thin-Film Specimen Preparation Equipment); Introduction of Wafer Edge SEM Review;
  • Vol. 39 No. 2, 2004 Vol. 39 No. 2, 2004
    TEM Study of Water in Carbon Nanotubes; A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy; Introduction of JWS-2000 Review SEM; Grazing-Exit Electron Probe Microanalysis (GE-EPMA); Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century; Introduction of Products;
  • Vol. 39 No. 1, 2004 Vol. 39 No. 1, 2004
    A Double Aberration Corrected, Energy Filtered HREM/STEM; Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F; The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM; Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva; ALCHEMI Studies on Quasicrystals; Electron Spin Resonance Spectroscopy in Food Radiation Research; Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM; Introduction of new products;