JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Progress in Photonic Crystal Lasers and Their Application to LiDAR
    • And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
    • Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
    • Characterization of Localized Physical Properties Using High Resolution EELS
    • In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
    • Degradation Analysis for Polymer Materials by Spin-Trapping
    • High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
    • System to the Specimen in Transmission Electron Microscopy
    • The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens <SHL>
    • Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
    • Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
    • Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
    • MultiAnalyzer - Unknown Compounds Analysis System
      New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
    • Introduction to JEOL Products

JEOL NEWS Magazine (previous issues)


  • Vol. 39 No. 1, 2004 Vol. 39 No. 1, 2004
    • A Double Aberration Corrected, Energy Filtered HREM/STEM
    • Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
    • The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
    • Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
    • ALCHEMI Studies on Quasicrystals
    • Electron Spin Resonance Spectroscopy in Food Radiation Research
    • Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
    • Introduction of new products
  • Vol. 38 No. 2, 2003 Vol. 38 No. 2, 2003
    • Atomic Resolved HAADF-STEM for Composition Analysis
    • Atomic Structure Analysis
    • Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
    • Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
    • Electron Spin Resonance (ESR) in Nanocarbon Research
    • Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
    • JWS-3000 High-Resolution Review SEM
    • Application and Extension of Pickup Method to Various Materials
    • Introduction of New Products
  • Vol. 38 No. 1, 2003 Vol. 38 No. 1, 2003
    • Mapping of sp2/sp3 in DLC Thin Film by Signal Processed ESI series Energy Loss Image
    • Electron Holographic Analysis of Nanostructured Gold Catalyst
    • Single Atomic Column Observation in Silicon Boundary
    • The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
    • Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
    • Protein NMR - Ability of the JNM-ECA series
    • Development of the JBX-3030MV Mask Making E-Beam Lithography System
    • Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
    • Peak Deconvolution Analysis in Auger Electron Spectroscopy II
    • Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
    • Introduction of New Products
  • Vol. 54 No. 1, July 2019 Vol. 54 No. 1, July 2019
    • Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
    • Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
    • Analytical SEM and TEM: Applications in Product-related Material Development
    • Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
    • Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
    • Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
    • High-Field DNP Using Closed-Cycle Helium MAS System
    • Application of "operando -ESR" to Organic Electronics Materials
    • YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
    ‒ Characterization of Biomimetic Lacquer ‒
    • Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
    • Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
    • Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
    • Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
  • Vol. 56 No. 1, July 2021 Vol. 56 No. 1, July 2021
    • Progress in Photonic Crystal Lasers and Their Application to LiDAR
    • And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
    • Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
    • Characterization of Localized Physical Properties Using High Resolution EELS
    • In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
    • Degradation Analysis for Polymer Materials by Spin-Trapping
    • High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
    • System to the Specimen in Transmission Electron Microscopy
    • The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens
    • Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
    • Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
    • Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
    • MultiAnalyzer - Unknown Compounds Analysis System
    • New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
    • Introduction to JEOL Products