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Vol. 48 No. 1, July 2013
• Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
• Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
• Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
• Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
• Introduction of New Products
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Vol. 47 No. 1, July 2012
• High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
• Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
• Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
• A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
• Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
• Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
• Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
• Introduction of New Products
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Vol. 46 No. 1, July 2011
• Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
• Exploring Biological Samples in 3D Beyond Classic Electron Tomography
• Application of Scanning Electron Microscope to Dislocation Imaging in Steel
• Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
• Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
• Development of JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope
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Vol. 45 No. 1, July 2010
• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES
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Vol. 44 No. 1, July 2009
• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products
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Vol. 43 No. 1, July 2008
• Interface Studies by Cs-Corrected STEM
• Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
• Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
• Quantitative Electron Microscopy Using Digital Data Processing
• Case Study on Failure Analysis by Electron Beam Absorbed Current Method
• Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
• Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
• High Power Electron Beam Source Used for Melting Metal Materials
• Introduction of New Products
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Vol. 42 No. 1, July 2007
• Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
• Improvement of Reflection Electron Microscopy: LODREM
• Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
• A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
• High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
• Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
• New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
• Auger Analyses Using Low Angle Incident Electrons
• Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
• Introduction of New Products
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Vol. 41 No. 1, July 2006
• The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
• Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
• Visualization of Biological Nano-Machines at Subnanometer Resolutions
• Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
• Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
• Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
• Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
• Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy
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Vol. 40 No. 1, July 2005
• Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
• Direct Analysis in Real Time (DART™) Mass Spectrometry
• High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
• Recent Development of TEM for Advanced Ceramics
• Advanced Analysis Technology Supporting SiP
• FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
• 100 Sample Auto Sample Changer and Tubeless NMR
• Windows Delta
• Latest Information and Future for ALICE2 Software)
• Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
• Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
• Introduction of Wafer Edge SEM Review
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Vol. 39 No. 2, 2004
• TEM Study of Water in Carbon Nanotubes
• A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
• Introduction of JWS-2000 Review SEM
• Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
• Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
• Introduction of Products
Vol. 54 No. 1, July 2019
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
Vol. 56 No. 1, July 2021
• Progress in Photonic Crystal Lasers and Their Application to LiDAR
• And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
• Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
• Characterization of Localized Physical Properties Using High Resolution EELS
• In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
• Degradation Analysis for Polymer Materials by Spin-Trapping
• High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
• System to the Specimen in Transmission Electron Microscopy
• The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens
• Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
• Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
• Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
• MultiAnalyzer - Unknown Compounds Analysis System
• New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
• Introduction to JEOL Products
• Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
• Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
• Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
• Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
• Introduction of New Products
• High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
• Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
• Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
• A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
• Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
• Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
• Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
• Introduction of New Products
• Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
• Exploring Biological Samples in 3D Beyond Classic Electron Tomography
• Application of Scanning Electron Microscope to Dislocation Imaging in Steel
• Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
• Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
• Development of JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope
• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES
• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products
• Interface Studies by Cs-Corrected STEM
• Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
• Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
• Quantitative Electron Microscopy Using Digital Data Processing
• Case Study on Failure Analysis by Electron Beam Absorbed Current Method
• Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
• Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
• High Power Electron Beam Source Used for Melting Metal Materials
• Introduction of New Products
• Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
• Improvement of Reflection Electron Microscopy: LODREM
• Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
• A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
• High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
• Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
• New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
• Auger Analyses Using Low Angle Incident Electrons
• Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
• Introduction of New Products
• The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
• Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
• Visualization of Biological Nano-Machines at Subnanometer Resolutions
• Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
• Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
• Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
• Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
• Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy
• Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
• Direct Analysis in Real Time (DART™) Mass Spectrometry
• High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
• Recent Development of TEM for Advanced Ceramics
• Advanced Analysis Technology Supporting SiP
• FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
• 100 Sample Auto Sample Changer and Tubeless NMR
• Windows Delta
• Latest Information and Future for ALICE2 Software)
• Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
• Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
• Introduction of Wafer Edge SEM Review
• TEM Study of Water in Carbon Nanotubes
• A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
• Introduction of JWS-2000 Review SEM
• Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
• Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
• Introduction of Products
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
• Progress in Photonic Crystal Lasers and Their Application to LiDAR
• And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
• Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
• Characterization of Localized Physical Properties Using High Resolution EELS
• In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
• Degradation Analysis for Polymer Materials by Spin-Trapping
• High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
• System to the Specimen in Transmission Electron Microscopy
• The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens
• Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
• Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
• Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
• MultiAnalyzer - Unknown Compounds Analysis System
• New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
• Introduction to JEOL Products