JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
    • Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
    • Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast
      Scanning Transmission Electron Microscopy
    • Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
    • Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
    • Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
    • Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
    • Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh
      Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
    • Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
    • Introduction of Newly Developed Electron Probe Micro Analyzers
    • High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
      Combined with Large-Volume Injection Technique and Fast-GC Method
    • Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
      Laser Desorption Ionization Time-of-Flight Mass Spectrometer
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

  • Vol. 44 No. 1, July 2009 Vol. 44 No. 1, July 2009
    • Congratulatory Message for the 60th Anniversary of JEOL
    • Congratulations from Arizona State University
    • Marking Our 60th Anniversary
    • Aiming for Best Total Solutions
    • Exit Wavefunction Reconstruction
    • Single Shot Nanosecond Imaging in the Dynamic TEM
    • An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
    • Observation of Membrane Proteins Through An Electron Beam
    • HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
    • Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
    • Development of Nanoimprint Mold Using JBX-9300FS
    • Introduction of New Products
  • Vol. 43 No. 1, July 2008 Vol. 43 No. 1, July 2008
    • Interface Studies by Cs-Corrected STEM
    • Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
    • Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
    • Quantitative Electron Microscopy Using Digital Data Processing
    • Case Study on Failure Analysis by Electron Beam Absorbed Current Method
    • Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
    • Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
    • High Power Electron Beam Source Used for Melting Metal Materials
    • Introduction of New Products
  • Vol. 42 No. 1, July 2007 Vol. 42 No. 1, July 2007
    • Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
    • Improvement of Reflection Electron Microscopy: LODREM
    • Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
    • A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
    • High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
    • Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
    • New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
    • Auger Analyses Using Low Angle Incident Electrons
    • Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
    • Introduction of New Products
  • Vol. 41 No. 1, July 2006 Vol. 41 No. 1, July 2006
    • The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
    • Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
    • Visualization of Biological Nano-Machines at Subnanometer Resolutions
    • Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
    • Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
    • Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
    • Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
    • Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy
  • Vol. 40 No. 1, July 2005 Vol. 40 No. 1, July 2005
    • Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
    • Direct Analysis in Real Time (DART™) Mass Spectrometry
    • High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
    • Recent Development of TEM for Advanced Ceramics
    • Advanced Analysis Technology Supporting SiP
    • FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
    • 100 Sample Auto Sample Changer and Tubeless NMR
    • Windows Delta
    • Latest Information and Future for ALICE2 Software)
    • Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
    • Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
    • Introduction of Wafer Edge SEM Review
  • Vol. 39 No. 2, 2004 Vol. 39 No. 2, 2004
    • TEM Study of Water in Carbon Nanotubes
    • A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
    • Introduction of JWS-2000 Review SEM
    • Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
    • Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
    • Introduction of Products
  • Vol. 39 No. 1, 2004 Vol. 39 No. 1, 2004
    • A Double Aberration Corrected, Energy Filtered HREM/STEM
    • Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
    • The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
    • Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
    • ALCHEMI Studies on Quasicrystals
    • Electron Spin Resonance Spectroscopy in Food Radiation Research
    • Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
    • Introduction of new products
  • Vol. 38 No. 2, 2003 Vol. 38 No. 2, 2003
    • Atomic Resolved HAADF-STEM for Composition Analysis
    • Atomic Structure Analysis
    • Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
    • Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
    • Electron Spin Resonance (ESR) in Nanocarbon Research
    • Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
    • JWS-3000 High-Resolution Review SEM
    • Application and Extension of Pickup Method to Various Materials
    • Introduction of New Products
  • Vol. 38 No. 1, 2003 Vol. 38 No. 1, 2003
    • Mapping of sp2/sp3 in DLC Thin Film by Signal Processed ESI series Energy Loss Image
    • Electron Holographic Analysis of Nanostructured Gold Catalyst
    • Single Atomic Column Observation in Silicon Boundary
    • The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
    • Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
    • Protein NMR - Ability of the JNM-ECA series
    • Development of the JBX-3030MV Mask Making E-Beam Lithography System
    • Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
    • Peak Deconvolution Analysis in Auger Electron Spectroscopy II
    • Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
    • Introduction of New Products
  • Vol. 37 No. 1, July 2002 Vol. 37 No. 1, July 2002
    • A Cs Corrected HRTEM: Initial Applications in Materials Science
    • Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
    • Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
    • Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
    • Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
    • A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
    • Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
    • Development of Nano-Analysis Electron Microscope JEM-2500SE
    • Development of JSM-7400F
    • New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
    • Applications of Image Processing Technology in Electron Probe Microanalyzer
    • Technology of Measuring Contact Holes Using Electric Charge in a Specimen
    • Organic EL Display Production Systems - ELVESS Series
    • In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
    • Peak Deconvolution of Analysis in Auger Electron Spectroscopy
    • JEOL's Challenge to Nanotechnology
    • Progress in Development of High-Density Reactive Ion Plating
    • Applications of High-Power Built-in Plasma Gun
    • Introduction of New Products
Prev123Next
  • Vol. 54 No. 1, July 2019 Vol. 54 No. 1, July 2019
    • Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
    • Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
    • Analytical SEM and TEM: Applications in Product-related Material Development
    • Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
    • Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
    • Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
    • High-Field DNP Using Closed-Cycle Helium MAS System
    • Application of "operando -ESR" to Organic Electronics Materials
    • YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
    ‒ Characterization of Biomimetic Lacquer ‒
    • Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
    • Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
    • Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
    • Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
  • Vol. 55 No. 1, July 2020 Vol. 55 No. 1, July 2020
    • Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
    • Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
    • Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast Scanning Transmission Electron Microscopy
    • Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
    • Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
    • Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
    • Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
    • Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
    • Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
    • Introduction of Newly Developed Electron Probe Micro Analyzers
    • High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
    Combined with Large-Volume Injection Technique and Fast-GC Method
    • Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
    Laser Desorption Ionization Time-of-Flight Mass Spectrometer
    • Introduction of JEOL Products