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Vol. 49 No. 1, Sept. 2014
• Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
• Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
• Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
• Photonic Crystal Lasers
• Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
• Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
• Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
• Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
• Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
• Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
• New Series of NMR Spectrometers JNM-ECZ
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Vol. 48 No. 1, July 2013
• Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
• Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
• Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
• Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
• Introduction of New Products
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Vol. 47 No. 1, July 2012
• High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
• Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
• Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
• A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
• Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
• Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
• Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
• Introduction of New Products
-
Vol. 46 No. 1, July 2011
• Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
• Exploring Biological Samples in 3D Beyond Classic Electron Tomography
• Application of Scanning Electron Microscope to Dislocation Imaging in Steel
• Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
• Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
• Development of JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope
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Vol. 45 No. 1, July 2010
• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES
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Vol. 44 No. 1, July 2009
• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products
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Vol. 43 No. 1, July 2008
• Interface Studies by Cs-Corrected STEM
• Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
• Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
• Quantitative Electron Microscopy Using Digital Data Processing
• Case Study on Failure Analysis by Electron Beam Absorbed Current Method
• Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
• Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
• High Power Electron Beam Source Used for Melting Metal Materials
• Introduction of New Products
-
Vol. 42 No. 1, July 2007
• Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
• Improvement of Reflection Electron Microscopy: LODREM
• Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
• A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
• High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
• Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
• New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
• Auger Analyses Using Low Angle Incident Electrons
• Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
• Introduction of New Products
-
Vol. 41 No. 1, July 2006
• The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
• Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
• Visualization of Biological Nano-Machines at Subnanometer Resolutions
• Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
• Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
• Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
• Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
• Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy
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Vol. 40 No. 1, July 2005
• Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
• Direct Analysis in Real Time (DART™) Mass Spectrometry
• High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
• Recent Development of TEM for Advanced Ceramics
• Advanced Analysis Technology Supporting SiP
• FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
• 100 Sample Auto Sample Changer and Tubeless NMR
• Windows Delta
• Latest Information and Future for ALICE2 Software)
• Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
• Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
• Introduction of Wafer Edge SEM Review
Vol. 54 No. 1, July 2019
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
Vol. 57 No. 1, June 2022
• Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
• Accurate Quantification of Qn Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
• Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
• Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
• Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
• New Semi-in-lens SEM JSM-IT800 <i>/<is> Excellent for Semiconductor Device Observation
• Automated TEM Iamella Preparation with JIB-4700F
• Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
• Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
• Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
• Introduction to JEOL Products
• Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
• Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
• Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
• Photonic Crystal Lasers
• Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
• Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
• Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
• Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
• Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
• Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
• New Series of NMR Spectrometers JNM-ECZ
• Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
• Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
• Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
• Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
• Introduction of New Products
• High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
• Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
• Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
• A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
• Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
• Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
• Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
• Introduction of New Products
• Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
• Exploring Biological Samples in 3D Beyond Classic Electron Tomography
• Application of Scanning Electron Microscope to Dislocation Imaging in Steel
• Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
• Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
• Development of JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope
• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES
• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products
• Interface Studies by Cs-Corrected STEM
• Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
• Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
• Quantitative Electron Microscopy Using Digital Data Processing
• Case Study on Failure Analysis by Electron Beam Absorbed Current Method
• Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
• Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
• High Power Electron Beam Source Used for Melting Metal Materials
• Introduction of New Products
• Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
• Improvement of Reflection Electron Microscopy: LODREM
• Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
• A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
• High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
• Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
• New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
• Auger Analyses Using Low Angle Incident Electrons
• Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
• Introduction of New Products
• The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
• Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
• Visualization of Biological Nano-Machines at Subnanometer Resolutions
• Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
• Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
• Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
• Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
• Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy
• Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
• Direct Analysis in Real Time (DART™) Mass Spectrometry
• High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
• Recent Development of TEM for Advanced Ceramics
• Advanced Analysis Technology Supporting SiP
• FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
• 100 Sample Auto Sample Changer and Tubeless NMR
• Windows Delta
• Latest Information and Future for ALICE2 Software)
• Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
• Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
• Introduction of Wafer Edge SEM Review
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
• Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
• Accurate Quantification of Qn Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
• Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
• Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
• Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
• New Semi-in-lens SEM JSM-IT800 <i>/<is> Excellent for Semiconductor Device Observation
• Automated TEM Iamella Preparation with JIB-4700F
• Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
• Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
• Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
• Introduction to JEOL Products