JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Revealing the Latent Atomic World through Data-Driven Microscopy
    • Imaging Zeolite Architecture by Hight Resolution Scanning Electron Microscopy: When Physical and Chemical Etching Meet
    • Low-Dose Atomic-Resolution Observation of Beam-Sensitive Materials via OBF STEM
    • Advanced Analytical Methods for the Evaluations of Olefin Polymerization Catalysts and Produced Polymers
    • A Practical Method for the Measurement of 183W NMR Signals in Solution: Challenge to Multinuclear Solution NMR
    • Introduction of Various Application Examples Obtained by Multi-Purpose TEM (JEM-F200) with Various Attachments
    • TEM Sample Preparation using JIB-PS500i and Multi-Purpose FIB-SEM
    • msFineANalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with AI Structural Analysis
    • He-less Light Element Analysis using a Low-Vacuum Liquid Sample Capsule by X-ray Fluorescence Spectrometry


JEOL NEWS Magazine (previous issues)

  • Vol. 47 No. 1, July 2012 Vol. 47 No. 1, July 2012
    • High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
    • Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
    • Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
    • A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
    • Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
    • Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
    • Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
    • Introduction of New Products
  • Vol. 46 No. 1, July 2011 Vol. 46 No. 1, July 2011
    • Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
    • Exploring Biological Samples in 3D Beyond Classic Electron Tomography
    • Application of Scanning Electron Microscope to Dislocation Imaging in Steel
    • Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
    • Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
    • Development of JEM-2800 High Throughput Electron Microscope
    • Introduction of New Product JEM-2800 High Throughput Electron Microscope
    • Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope
  • Vol. 45 No. 1, July 2010 Vol. 45 No. 1, July 2010
    • Lithium Atom Microscopy at Sub-50pm Resolution by R005
    • Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
    • Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
    • Ultrahigh-Resolution STEM Analysis of Complex Compounds
    • Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
    • JEM-2100: Applications in Nanotechnology
    • Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
    • Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
    • Micro Area Analysis with JXA-8530F (FE-EPMA)
    • Analysis of Insulator Samples with AES
  • Vol. 44 No. 1, July 2009 Vol. 44 No. 1, July 2009
    • Congratulatory Message for the 60th Anniversary of JEOL
    • Congratulations from Arizona State University
    • Marking Our 60th Anniversary
    • Aiming for Best Total Solutions
    • Exit Wavefunction Reconstruction
    • Single Shot Nanosecond Imaging in the Dynamic TEM
    • An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
    • Observation of Membrane Proteins Through An Electron Beam
    • HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
    • Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
    • Development of Nanoimprint Mold Using JBX-9300FS
    • Introduction of New Products
  • Vol. 43 No. 1, July 2008 Vol. 43 No. 1, July 2008
    • Interface Studies by Cs-Corrected STEM
    • Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
    • Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
    • Quantitative Electron Microscopy Using Digital Data Processing
    • Case Study on Failure Analysis by Electron Beam Absorbed Current Method
    • Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
    • Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
    • High Power Electron Beam Source Used for Melting Metal Materials
    • Introduction of New Products
  • Vol. 42 No. 1, July 2007 Vol. 42 No. 1, July 2007
    • Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
    • Improvement of Reflection Electron Microscopy: LODREM
    • Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
    • A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
    • High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
    • Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
    • New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
    • Auger Analyses Using Low Angle Incident Electrons
    • Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
    • Introduction of New Products
  • Vol. 41 No. 1, July 2006 Vol. 41 No. 1, July 2006
    • The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
    • Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
    • Visualization of Biological Nano-Machines at Subnanometer Resolutions
    • Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
    • Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
    • Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
    • Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
    • Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy
  • Vol. 40 No. 1, July 2005 Vol. 40 No. 1, July 2005
    • Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
    • Direct Analysis in Real Time (DART™) Mass Spectrometry
    • High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
    • Recent Development of TEM for Advanced Ceramics
    • Advanced Analysis Technology Supporting SiP
    • FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
    • 100 Sample Auto Sample Changer and Tubeless NMR
    • Windows Delta
    • Latest Information and Future for ALICE2 Software)
    • Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
    • Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
    • Introduction of Wafer Edge SEM Review
  • Vol. 39 No. 2, 2004 Vol. 39 No. 2, 2004
    • TEM Study of Water in Carbon Nanotubes
    • A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
    • Introduction of JWS-2000 Review SEM
    • Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
    • Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
    • Introduction of Products
  • Vol. 39 No. 1, 2004 Vol. 39 No. 1, 2004
    • A Double Aberration Corrected, Energy Filtered HREM/STEM
    • Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
    • The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
    • Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
    • ALCHEMI Studies on Quasicrystals
    • Electron Spin Resonance Spectroscopy in Food Radiation Research
    • Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
    • Introduction of new products
Prev123Next
  • Vol. 54 No. 1, July 2019 Vol. 54 No. 1, July 2019
    • Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
    • Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
    • Analytical SEM and TEM: Applications in Product-related Material Development
    • Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
    • Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
    • Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
    • High-Field DNP Using Closed-Cycle Helium MAS System
    • Application of "operando -ESR" to Organic Electronics Materials
    • YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
    ‒ Characterization of Biomimetic Lacquer ‒
    • Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
    • Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
    • Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
    • Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
  • Vol. 58 No. 1, July 2023 Vol. 58 No. 1, July 2023
    • Revealing the Latent Atomic World through Data-Driven Microscopy
    • Imaging Zeolite Architecture by Hight Resolution Scanning Electron Microscopy: When Physical and Chemical Etching Meet
    • Low-Dose Atomic-Resolution Observation of Beam-Sensitive Materials via OBF STEM
    • Advanced Analytical Methods for the Evaluations of Olefin Polymerization Catalysts and Produced Polymers
    • A Practical Method for the Measurement of 183W NMR Signals in Solution: Challenge to Multinuclear Solution NMR
    • Introduction of Various Application Examples Obtained by Multi-Purpose TEM (JEM-F200) with Various Attachments
    • TEM Sample Preparation using JIB-PS500i and Multi-Purpose FIB-SEM
    • msFineANalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with AI Structural Analysis
    • He-less Light Element Analysis using a Low-Vacuum Liquid Sample Capsule by X-ray Fluorescence Spectrometry
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