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Vol. 48 No. 1, July 2013
• Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
• Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
• Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
• Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
• Introduction of New Products
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Vol. 47 No. 1, July 2012
• High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
• Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
• Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
• A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
• Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
• Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
• Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
• Introduction of New Products
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Vol. 46 No. 1, July 2011
• Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
• Exploring Biological Samples in 3D Beyond Classic Electron Tomography
• Application of Scanning Electron Microscope to Dislocation Imaging in Steel
• Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
• Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
• Development of JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope
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Vol. 45 No. 1, July 2010
• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES
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Vol. 44 No. 1, July 2009
• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products
Vol. 54 No. 1, July 2019
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
• Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
• Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
• Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
• Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
• Introduction of New Products
• High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
• Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
• Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
• A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
• Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
• Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
• Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
• Introduction of New Products
• Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
• Exploring Biological Samples in 3D Beyond Classic Electron Tomography
• Application of Scanning Electron Microscope to Dislocation Imaging in Steel
• Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
• Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
• Development of JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope
• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES
• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC