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Vol. 44 No. 1, July 2009
• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products
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Vol. 43 No. 1, July 2008
• Interface Studies by Cs-Corrected STEM
• Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
• Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
• Quantitative Electron Microscopy Using Digital Data Processing
• Case Study on Failure Analysis by Electron Beam Absorbed Current Method
• Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
• Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
• High Power Electron Beam Source Used for Melting Metal Materials
• Introduction of New Products
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Vol. 42 No. 1, July 2007
• Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
• Improvement of Reflection Electron Microscopy: LODREM
• Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
• A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
• High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
• Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
• New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
• Auger Analyses Using Low Angle Incident Electrons
• Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
• Introduction of New Products
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Vol. 41 No. 1, July 2006
• The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
• Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
• Visualization of Biological Nano-Machines at Subnanometer Resolutions
• Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
• Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
• Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
• Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
• Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy
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Vol. 40 No. 1, July 2005
• Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
• Direct Analysis in Real Time (DART™) Mass Spectrometry
• High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
• Recent Development of TEM for Advanced Ceramics
• Advanced Analysis Technology Supporting SiP
• FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
• 100 Sample Auto Sample Changer and Tubeless NMR
• Windows Delta
• Latest Information and Future for ALICE2 Software)
• Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
• Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
• Introduction of Wafer Edge SEM Review
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Vol. 39 No. 2, 2004
• TEM Study of Water in Carbon Nanotubes
• A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
• Introduction of JWS-2000 Review SEM
• Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
• Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
• Introduction of Products
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Vol. 39 No. 1, 2004
• A Double Aberration Corrected, Energy Filtered HREM/STEM
• Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
• The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
• Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
• ALCHEMI Studies on Quasicrystals
• Electron Spin Resonance Spectroscopy in Food Radiation Research
• Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
• Introduction of new products
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Vol. 38 No. 2, 2003
• Atomic Resolved HAADF-STEM for Composition Analysis
• Atomic Structure Analysis
• Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
• Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
• Electron Spin Resonance (ESR) in Nanocarbon Research
• Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
• JWS-3000 High-Resolution Review SEM
• Application and Extension of Pickup Method to Various Materials
• Introduction of New Products
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Vol. 38 No. 1, 2003
• Mapping of sp2/sp3 in DLC Thin Film by Signal Processed ESI series Energy Loss Image
• Electron Holographic Analysis of Nanostructured Gold Catalyst
• Single Atomic Column Observation in Silicon Boundary
• The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
• Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
• Protein NMR - Ability of the JNM-ECA series
• Development of the JBX-3030MV Mask Making E-Beam Lithography System
• Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
• Peak Deconvolution Analysis in Auger Electron Spectroscopy II
• Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
• Introduction of New Products
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Vol. 37 No. 1, July 2002
• A Cs Corrected HRTEM: Initial Applications in Materials Science
• Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
• Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
• Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
• Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
• A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
• Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
• Development of Nano-Analysis Electron Microscope JEM-2500SE
• Development of JSM-7400F
• New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
• Applications of Image Processing Technology in Electron Probe Microanalyzer
• Technology of Measuring Contact Holes Using Electric Charge in a Specimen
• Organic EL Display Production Systems - ELVESS Series
• In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
• Peak Deconvolution of Analysis in Auger Electron Spectroscopy
• JEOL's Challenge to Nanotechnology
• Progress in Development of High-Density Reactive Ion Plating
• Applications of High-Power Built-in Plasma Gun
• Introduction of New Products
Vol. 54 No. 1, July 2019
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
Vol. 55 No. 1, July 2020
• Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
• Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
• Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast Scanning Transmission Electron Microscopy
• Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
• Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
• Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
• Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
• Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
• Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
• Introduction of Newly Developed Electron Probe Micro Analyzers
• High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
Combined with Large-Volume Injection Technique and Fast-GC Method
• Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
Laser Desorption Ionization Time-of-Flight Mass Spectrometer
• Introduction of JEOL Products
• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products
• Interface Studies by Cs-Corrected STEM
• Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
• Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
• Quantitative Electron Microscopy Using Digital Data Processing
• Case Study on Failure Analysis by Electron Beam Absorbed Current Method
• Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
• Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
• High Power Electron Beam Source Used for Melting Metal Materials
• Introduction of New Products
• Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
• Improvement of Reflection Electron Microscopy: LODREM
• Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
• A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
• High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
• Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
• New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
• Auger Analyses Using Low Angle Incident Electrons
• Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
• Introduction of New Products
• The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
• Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
• Visualization of Biological Nano-Machines at Subnanometer Resolutions
• Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
• Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
• Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
• Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
• Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy
• Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
• Direct Analysis in Real Time (DART™) Mass Spectrometry
• High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
• Recent Development of TEM for Advanced Ceramics
• Advanced Analysis Technology Supporting SiP
• FT NMR New Technical Introduction (Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
• 100 Sample Auto Sample Changer and Tubeless NMR
• Windows Delta
• Latest Information and Future for ALICE2 Software)
• Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
• Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
• Introduction of Wafer Edge SEM Review
• TEM Study of Water in Carbon Nanotubes
• A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
• Introduction of JWS-2000 Review SEM
• Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
• Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
• Introduction of Products
• A Double Aberration Corrected, Energy Filtered HREM/STEM
• Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
• The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
• Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
• ALCHEMI Studies on Quasicrystals
• Electron Spin Resonance Spectroscopy in Food Radiation Research
• Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
• Introduction of new products
• Atomic Resolved HAADF-STEM for Composition Analysis
• Atomic Structure Analysis
• Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
• Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
• Electron Spin Resonance (ESR) in Nanocarbon Research
• Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
• JWS-3000 High-Resolution Review SEM
• Application and Extension of Pickup Method to Various Materials
• Introduction of New Products
• Mapping of sp2/sp3 in DLC Thin Film by Signal Processed ESI series Energy Loss Image
• Electron Holographic Analysis of Nanostructured Gold Catalyst
• Single Atomic Column Observation in Silicon Boundary
• The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
• Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
• Protein NMR - Ability of the JNM-ECA series
• Development of the JBX-3030MV Mask Making E-Beam Lithography System
• Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
• Peak Deconvolution Analysis in Auger Electron Spectroscopy II
• Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
• Introduction of New Products
• A Cs Corrected HRTEM: Initial Applications in Materials Science
• Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
• Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
• Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
• Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
• A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
• Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
• Development of Nano-Analysis Electron Microscope JEM-2500SE
• Development of JSM-7400F
• New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
• Applications of Image Processing Technology in Electron Probe Microanalyzer
• Technology of Measuring Contact Holes Using Electric Charge in a Specimen
• Organic EL Display Production Systems - ELVESS Series
• In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
• Peak Deconvolution of Analysis in Auger Electron Spectroscopy
• JEOL's Challenge to Nanotechnology
• Progress in Development of High-Density Reactive Ion Plating
• Applications of High-Power Built-in Plasma Gun
• Introduction of New Products
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
• Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
• Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
• Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast Scanning Transmission Electron Microscopy
• Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
• Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
• Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
• Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
• Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
• Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
• Introduction of Newly Developed Electron Probe Micro Analyzers
• High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
Combined with Large-Volume Injection Technique and Fast-GC Method
• Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
Laser Desorption Ionization Time-of-Flight Mass Spectrometer
• Introduction of JEOL Products