JEOL NEWS Magazine

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  • JEOL NEWS June 2022 Vol. 57 No. 1

  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
    • Accurate Quantification of Qn Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
    • Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
    • Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
    • Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
    • New Semi-in-lens SEM JSM-IT800 <i>/<is> Excellent for Semiconductor Device Observation
    • Automated TEM Iamella Preparation with JIB-4700F
    • Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
    • Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
    • Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
    • Introduction to JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 45 No. 1, July 2010

• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES

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