JEOL NEWS Magazine

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    • Revealing the Latent Atomic World through Data-Driven Microscopy
    • Imaging Zeolite Architecture by Hight Resolution Scanning Electron Microscopy: When Physical and Chemical Etching Meet
    • Low-Dose Atomic-Resolution Observation of Beam-Sensitive Materials via OBF STEM
    • Advanced Analytical Methods for the Evaluations of Olefin Polymerization Catalysts and Produced Polymers
    • A Practical Method for the Measurement of 183W NMR Signals in Solution: Challenge to Multinuclear Solution NMR
    • Introduction of Various Application Examples Obtained by Multi-Purpose TEM (JEM-F200) with Various Attachments
    • TEM Sample Preparation using JIB-PS500i and Multi-Purpose FIB-SEM
    • msFineANalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with AI Structural Analysis
    • He-less Light Element Analysis using a Low-Vacuum Liquid Sample Capsule by X-ray Fluorescence Spectrometry

JEOL NEWS Magazine (previous issues)

Vol. 41 No. 1, July 2006

• The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
• Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
• Visualization of Biological Nano-Machines at Subnanometer Resolutions
• Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
• Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
• Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
• Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass Spectrometry
• Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy

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