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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT210
JSM-IT510
High-Res, Large-Chamber SEM
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Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT810
SEM-FIB
JIB-4700F / MultiBeam
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Elemental Analysis
Transmission Electron Microscopes (TEM)
120 kV
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200 kV
NEOARM
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JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
CRYO-FIB-SEM
JIB-PS500i
JIB-4700F
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
UV Cleaner
Auto Fine Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Cryogen Reclamation System
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis AI
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
msRepeatFinder Polymer Analysis Software
MALDI Imaging SpiralTOF
UltraFOCUS DIOXIN Analysis
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-A9
JBX-8100FS
JBX-3050MV
Elemental Analysis
Embedded EDS for SEM
Gather-X Windowless EDS
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
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SEE MORE HERE
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SEM Applications
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REALab Customer Stories
Center for Biologic Imaging at University of Pittsburgh
Lake Superior State University
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
Documents & Downloads
Image Gallery
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Links & Resources
Videos
Scanning Electron Microscopy Basics
Analytical Instruments
Documents & Downloads
Walkup NMR
Reference Data
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No-D NMR
Non Uniform Sampling (NUS)
Mass Spectrometry Basics
NMR Basics
NMR Magnet Destruction
Photomask / Direct Write Lithography
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NEWS & EVENTS
JEOL NEWS Magazine
JEOL NEWS Magazine
Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:
Cryo-Electron Ptycography: Applications in the Characterisation of Biological Samples
Current Status and Future Development of In-situ Liquid Cell Transmission Electron Microscopy
Broad Ar Ion Beam Milling Improves EBSD Analysis of Phyllosilicates
Complete Classification, Separation, and Accurate Analysis of Fragment Ions Produced by Electron Ionization of Methyl Stearate using a High-Performance Mass Spectrometer
Observation of Radicals in Clathrate Hydrates and Silica Clathrates
Microstructure Analysis of Carbon and Nitrogen in Nitrocarburized Carbon Steel Using EPMA Scatter Diagram Method
Crystal Structure Elucidation of Small Organic Molecules: Combined Approach of 3D Electron Diffraction and SOlid-State NMR
Operando Observation Using an In-situ Gas Reaction System Connected to a Transmission Electron Microscope (TEM) and a Mass Spectrometer (MS)
Development of JBX-A9, Electron Beam Lithography System
Introduction of JEOL Products
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Comments
What type of instrument do you use most often?
EPMA
Mass Spec
TEM
FIB
NMR
Sample Prep
Lithography
SEM
Job Title - old
Please enter your industry
JEOL NEWS Magazine (previous issues)
Vol. 54 No. 1, July 2019
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
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