JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • The Crucial Role of the Elelectron Microprobe in Solving Micro-Analytical Problems in Earth Sciences and Archaeometry
    • Three-Dimensional Digital Structural Analysis of Olfactory Neural Circuits - Exploring possibilities of biological analyses by electron microscopy
    • Novel Cellular Structures and Physiological Traits of Novel Phyla Bacteria Revealed by Cryo-Electron Microscopy
    • X-ray and Electron-Beam Analyses for Teeth of Chiton Accumulating Iron at High Concentrations
    • Time-Resolved ESR Method for Observing Rapid Radical Reactions
    • JEM-120i, a 120 kV Transmission Electron Microscope with Compact Appearance and Ease of Use - Its Features and Applications
    • Progressing from Easy to Automatic - Overcoming Challenges of Automation with the Latest FE-SEM JSM-IT810
    • Development of a Large Solid-Angle Windowless EDS Detector "Gather-X" Used with a Field Emission Scanning Electron Microscope (FE-SEM)
    • Introduction of the New Cryo-FIB-SEM "CryoLameller"
    • Advancement of Technological Development of an Electron Beam Metal 3D Printer JAM-5200EBM
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 37 No. 1, July 2002

• A Cs Corrected HRTEM: Initial Applications in Materials Science
• Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
• Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
• Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
• Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
• A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
• Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
• Development of Nano-Analysis Electron Microscope JEM-2500SE
• Development of JSM-7400F
• New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
• Applications of Image Processing Technology in Electron Probe Microanalyzer
• Technology of Measuring Contact Holes Using Electric Charge in a Specimen
• Organic EL Display Production Systems - ELVESS Series
• In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
• Peak Deconvolution of Analysis in Auger Electron Spectroscopy
• JEOL's Challenge to Nanotechnology
• Progress in Development of High-Density Reactive Ion Plating
• Applications of High-Power Built-in Plasma Gun
• Introduction of New Products

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