JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Revealing the Latent Atomic World through Data-Driven Microscopy
    • Imaging Zeolite Architecture by Hight Resolution Scanning Electron Microscopy: When Physical and Chemical Etching Meet
    • Low-Dose Atomic-Resolution Observation of Beam-Sensitive Materials via OBF STEM
    • Advanced Analytical Methods for the Evaluations of Olefin Polymerization Catalysts and Produced Polymers
    • A Practical Method for the Measurement of 183W NMR Signals in Solution: Challenge to Multinuclear Solution NMR
    • Introduction of Various Application Examples Obtained by Multi-Purpose TEM (JEM-F200) with Various Attachments
    • TEM Sample Preparation using JIB-PS500i and Multi-Purpose FIB-SEM
    • msFineANalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with AI Structural Analysis
    • He-less Light Element Analysis using a Low-Vacuum Liquid Sample Capsule by X-ray Fluorescence Spectrometry


JEOL NEWS Magazine (previous issues)

Vol. 39 No. 2, 2004

• TEM Study of Water in Carbon Nanotubes
• A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
• Introduction of JWS-2000 Review SEM
• Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
• Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
• Introduction of Products

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