JEOL NEWS Magazine

  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Progress in Photonic Crystal Lasers and Their Application to LiDAR
    • And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
    • Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
    • Characterization of Localized Physical Properties Using High Resolution EELS
    • In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
    • Degradation Analysis for Polymer Materials by Spin-Trapping
    • High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
    • System to the Specimen in Transmission Electron Microscopy
    • The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens <SHL>
    • Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
    • Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
    • Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
    • MultiAnalyzer - Unknown Compounds Analysis System
      New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
    • Introduction to JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 34 No. 1, July 1999

A 1000kV TEM Running Over 25 Years
• Atomic Resolution Z-Contrast Imaging of Interfaces and Defects
• The Growing Role of Electron Crystallography in Structural Biology
• Factors Promoting R&D in Electron Microscopy in Japan
• The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
• Immunogold-labeling in Scanning Electron Microscopy
• Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
• Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
• Miniaturized STM Working Simultaneously in UHV Electron Microscope
• High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
• Development of Optical Technology for JEOL's Electron Probe Instruments
• Observation of Protein Structures through an Electron Beam
• Transition of JEOL's Semiconductor Equipment, and Future Development
• Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
• Development History of JEOL's Transmission Electron Microscopes

Showing 0 Comment