JEOL NEWS Magazine

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- Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
- Accurate Quantification of Qⁿ Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
- Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
- Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
- Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
- New Semi-in-lens SEM JSM-IT800 <i>/<is> Excellent for Semiconductor Device Observation
- Automated TEM Iamella Preparation with JIB-4700F
- Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
- Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
- Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
- Introduction to JEOL Products
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JEOL NEWS Magazine (previous issues)

Vol. 34 No. 1, July 1999

A 1000kV TEM Running Over 25 Years
• Atomic Resolution Z-Contrast Imaging of Interfaces and Defects
• The Growing Role of Electron Crystallography in Structural Biology
• Factors Promoting R&D in Electron Microscopy in Japan
• The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
• Immunogold-labeling in Scanning Electron Microscopy
• Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
• Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
• Miniaturized STM Working Simultaneously in UHV Electron Microscope
• High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
• Development of Optical Technology for JEOL's Electron Probe Instruments
• Observation of Protein Structures through an Electron Beam
• Transition of JEOL's Semiconductor Equipment, and Future Development
• Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
• Development History of JEOL's Transmission Electron Microscopes