JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Revealing the Latent Atomic World through Data-Driven Microscopy
    • Imaging Zeolite Architecture by Hight Resolution Scanning Electron Microscopy: When Physical and Chemical Etching Meet
    • Low-Dose Atomic-Resolution Observation of Beam-Sensitive Materials via OBF STEM
    • Advanced Analytical Methods for the Evaluations of Olefin Polymerization Catalysts and Produced Polymers
    • A Practical Method for the Measurement of 183W NMR Signals in Solution: Challenge to Multinuclear Solution NMR
    • Introduction of Various Application Examples Obtained by Multi-Purpose TEM (JEM-F200) with Various Attachments
    • TEM Sample Preparation using JIB-PS500i and Multi-Purpose FIB-SEM
    • msFineANalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with AI Structural Analysis
    • He-less Light Element Analysis using a Low-Vacuum Liquid Sample Capsule by X-ray Fluorescence Spectrometry


JEOL NEWS Magazine (previous issues)

Vol. 53 No. 1, July 2018

• Fast Pixelated Detectors: A New Era for STEM
• Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
• Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
• Electronic State Analysis by Monochromated STEM-EELS
• Chemical State Analyses by Soft X-ray Emission Spectroscopy
• X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
• Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
• Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
• Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
• Development of the JBX-8100FS Electron Beam Lithography System

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