JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • The Crucial Role of the Elelectron Microprobe in Solving Micro-Analytical Problems in Earth Sciences and Archaeometry
    • Three-Dimensional Digital Structural Analysis of Olfactory Neural Circuits - Exploring possibilities of biological analyses by electron microscopy
    • Novel Cellular Structures and Physiological Traits of Novel Phyla Bacteria Revealed by Cryo-Electron Microscopy
    • X-ray and Electron-Beam Analyses for Teeth of Chiton Accumulating Iron at High Concentrations
    • Time-Resolved ESR Method for Observing Rapid Radical Reactions
    • JEM-120i, a 120 kV Transmission Electron Microscope with Compact Appearance and Ease of Use - Its Features and Applications
    • Progressing from Easy to Automatic - Overcoming Challenges of Automation with the Latest FE-SEM JSM-IT810
    • Development of a Large Solid-Angle Windowless EDS Detector "Gather-X" Used with a Field Emission Scanning Electron Microscope (FE-SEM)
    • Introduction of the New Cryo-FIB-SEM "CryoLameller"
    • Advancement of Technological Development of an Electron Beam Metal 3D Printer JAM-5200EBM
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 55 No. 1, July 2020

• Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
• Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
• Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast Scanning Transmission Electron Microscopy
• Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
• Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
• Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
• Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
• Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
• Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
• Introduction of Newly Developed Electron Probe Micro Analyzers
• High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
Combined with Large-Volume Injection Technique and Fast-GC Method
• Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
Laser Desorption Ionization Time-of-Flight Mass Spectrometer
• Introduction of JEOL Products

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