JEOL NEWS Magazine

Loading

  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Progress in Photonic Crystal Lasers and Their Application to LiDAR
    • And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
    • Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
    • Characterization of Localized Physical Properties Using High Resolution EELS
    • In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
    • Degradation Analysis for Polymer Materials by Spin-Trapping
    • High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
    • System to the Specimen in Transmission Electron Microscopy
    • The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens <SHL>
    • Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
    • Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
    • Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
    • MultiAnalyzer - Unknown Compounds Analysis System
      New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
    • Introduction to JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 50 No. 1, Sept. 2015

• Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics; Quantitative ADF STEM for Catalyst Nanoparticle Metrology
• Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
• Dressing Living Organisms in the NanoSuit® for FE-SEM Observation; Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
• Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
• 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
• Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
• Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
• Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
• New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
• Introduction of JEOL Products

Showing 0 Comment