JEOL NEWS Magazine

Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:
- Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
- Accurate Quantification of Qⁿ Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
- Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
- Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
- Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
- New Semi-in-lens SEM JSM-IT800 <i>/<is> Excellent for Semiconductor Device Observation
- Automated TEM Iamella Preparation with JIB-4700F
- Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
- Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
- Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
- Introduction to JEOL Products
Salutation
Mr.Mrs.Ms.Dr.Prof.None
First Name
Last Name
Job Title
Email
Country
State or Province
Organization
Market Segment
Industry
Comments
Job Title - old
Please enter your industry

JEOL NEWS Magazine (previous issues)

Vol. 50 No. 1, Sept. 2015

• Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics; Quantitative ADF STEM for Catalyst Nanoparticle Metrology
• Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
• Dressing Living Organisms in the NanoSuit® for FE-SEM Observation; Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
• Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
• 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
• Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
• Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
• Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
• New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
• Introduction of JEOL Products