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PRODUCTS
Scanning Electron Microscopes (SEM)
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JSM-IT510
High-Res, Large-Chamber SEM
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NeoScope Benchtop SEM
FE SEM
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Elemental Analysis
Transmission Electron Microscopes (TEM)
120 kV
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JEM-2100Plus
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JEM-ACE200F
300 kV
JEM-ARM300F2
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Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
TEMPO
PULSE System
Environmental Control Solutions
Focused Ion Beam
CRYO-FIB-SEM
JIB-PS500i
JIB-4700F
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
UV Cleaner
Auto Fine Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Cryogen Reclamation System
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis AI
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
msRepeatFinder Polymer Analysis Software
MALDI Imaging SpiralTOF
UltraFOCUS DIOXIN Analysis
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-A9
JBX-8100FS
JBX-3050MV
Elemental Analysis
Embedded EDS for SEM
Gather-X Windowless EDS
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
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Lake Superior State University
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JEOL NEWS Magazine
JEOL NEWS Magazine
Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:
Cryo-Electron Ptycography: Applications in the Characterisation of Biological Samples
Current Status and Future Development of In-situ Liquid Cell Transmission Electron Microscopy
Broad Ar Ion Beam Milling Improves EBSD Analysis of Phyllosilicates
Complete Classification, Separation, and Accurate Analysis of Fragment Ions Produced by Electron Ionization of Methyl Stearate using a High-Performance Mass Spectrometer
Observation of Radicals in Clathrate Hydrates and Silica Clathrates
Microstructure Analysis of Carbon and Nitrogen in Nitrocarburized Carbon Steel Using EPMA Scatter Diagram Method
Crystal Structure Elucidation of Small Organic Molecules: Combined Approach of 3D Electron Diffraction and SOlid-State NMR
Operando Observation Using an In-situ Gas Reaction System Connected to a Transmission Electron Microscope (TEM) and a Mass Spectrometer (MS)
Development of JBX-A9, Electron Beam Lithography System
Introduction of JEOL Products
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JEOL NEWS Magazine (previous issues)
Vol. 51 No. 1, July 2016
• Atomic Resolution Microscopy of Intermetallic Clathrates
• Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
• Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
• Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
• Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
• Visualization of Invisible Defects in Semiconductor Devices
• Development of Cryo-Coil MAS Probe for Multinuclear Measurement
• Development of JEM-F200(F2) Multi-Purpose Electron Microscope
• Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
• Depth Profile Measurement with JPS-9030
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