JEOL NEWS Magazine

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- Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
- Accurate Quantification of Qⁿ Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
- Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
- Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
- Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
- New Semi-in-lens SEM JSM-IT800 <i>/<is> Excellent for Semiconductor Device Observation
- Automated TEM Iamella Preparation with JIB-4700F
- Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
- Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
- Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
- Introduction to JEOL Products
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JEOL NEWS Magazine (previous issues)

Vol. 51 No. 1, July 2016

• Atomic Resolution Microscopy of Intermetallic Clathrates
• Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
• Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
• Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
• Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
• Visualization of Invisible Defects in Semiconductor Devices
• Development of Cryo-Coil MAS Probe for Multinuclear Measurement
• Development of JEM-F200(F2) Multi-Purpose Electron Microscope
• Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
• Depth Profile Measurement with JPS-9030