JEOL NEWS Magazine

Loading
  • JEOL NEWS June 2022 Vol. 57 No. 1

  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
    • Accurate Quantification of Qn Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
    • Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
    • Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
    • Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
    • New Semi-in-lens SEM JSM-IT800 <i>/<is> Excellent for Semiconductor Device Observation
    • Automated TEM Iamella Preparation with JIB-4700F
    • Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
    • Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
    • Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
    • Introduction to JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 51 No. 1, July 2016

• Atomic Resolution Microscopy of Intermetallic Clathrates
• Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
• Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
• Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
• Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
• Visualization of Invisible Defects in Semiconductor Devices
• Development of Cryo-Coil MAS Probe for Multinuclear Measurement
• Development of JEM-F200(F2) Multi-Purpose Electron Microscope
• Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
• Depth Profile Measurement with JPS-9030

Showing 0 Comment

    JEOL USA, Inc.
    11 Dearborn Road
    Peabody, MA 01960
    © Copyright 2022 by JEOL USA, Inc.
    Terms of Use
    |
    Privacy Policy
    |
    Cookie Preferences