JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Nanoscale Positioning Highly Coherent Spin Defects in Diamond Using JBX-8100FS
    • Development of a Semi-Automated 3D ED/MicroED System and Its Operation as a Shared-Use Facility
    • Structural Analysis of AMorphous Alumina Using Nuclear Magnetic Resonance Spectroscopy
    • High-Resolution STEM Image Acquisition Method for Tilted Specimen Using a New Type of Aberration Corrector
    • Structure Solution of Nano-Crystalline Powder: A YOKOGUSHI Approach of SynergyED, HRMS, NMR, and Computation
    • Toward Full Automation of Scanning Electron Microscopy: Automating Specimen Exchange and Measurement with Neo Action Robo
    • Introduction of In-situ Charge-Discharge Cycle System and Battery Application
    • Expansion of Crystal Orientation Analysis in Entry-Level SEM
    • Development of an Electron Spectroscopy System (f-HSA) and Its Application to High-Speed Spectrum Imaging
    • Development of an Ultra-Low Temperature Solid-State DNP-NMR System Using a Compact Microwave Source
    • Analysis of Metabolites in HeLa Cells Using GCxGC-TOFMS and Unknown Compounds Structure Analysis Software msFineAnalysisAI

JEOL NEWS Magazine (previous issues)

Vol. 58 No. 1, July 2023

• Revealing the Latent Atomic World through Data-Driven Microscopy
• Imaging Zeolite Architecture by Hight Resolution Scanning Electron Microscopy: When Physical and Chemical Etching Meet
• Low-Dose Atomic-Resolution Observation of Beam-Sensitive Materials via OBF STEM
• Advanced Analytical Methods for the Evaluations of Olefin Polymerization Catalysts and Produced Polymers
• A Practical Method for the Measurement of 183W NMR Signals in Solution: Challenge to Multinuclear Solution NMR
• Introduction of Various Application Examples Obtained by Multi-Purpose TEM (JEM-F200) with Various Attachments
• TEM Sample Preparation using JIB-PS500i and Multi-Purpose FIB-SEM
• msFineANalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with AI Structural Analysis
• He-less Light Element Analysis using a Low-Vacuum Liquid Sample Capsule by X-ray Fluorescence Spectrometry

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