JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • The Crucial Role of the Elelectron Microprobe in Solving Micro-Analytical Problems in Earth Sciences and Archaeometry
    • Three-Dimensional Digital Structural Analysis of Olfactory Neural Circuits - Exploring possibilities of biological analyses by electron microscopy
    • Novel Cellular Structures and Physiological Traits of Novel Phyla Bacteria Revealed by Cryo-Electron Microscopy
    • X-ray and Electron-Beam Analyses for Teeth of Chiton Accumulating Iron at High Concentrations
    • Time-Resolved ESR Method for Observing Rapid Radical Reactions
    • JEM-120i, a 120 kV Transmission Electron Microscope with Compact Appearance and Ease of Use - Its Features and Applications
    • Progressing from Easy to Automatic - Overcoming Challenges of Automation with the Latest FE-SEM JSM-IT810
    • Development of a Large Solid-Angle Windowless EDS Detector "Gather-X" Used with a Field Emission Scanning Electron Microscope (FE-SEM)
    • Introduction of the New Cryo-FIB-SEM "CryoLameller"
    • Advancement of Technological Development of an Electron Beam Metal 3D Printer JAM-5200EBM
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 58 No. 1, July 2023

• Revealing the Latent Atomic World through Data-Driven Microscopy
• Imaging Zeolite Architecture by Hight Resolution Scanning Electron Microscopy: When Physical and Chemical Etching Meet
• Low-Dose Atomic-Resolution Observation of Beam-Sensitive Materials via OBF STEM
• Advanced Analytical Methods for the Evaluations of Olefin Polymerization Catalysts and Produced Polymers
• A Practical Method for the Measurement of 183W NMR Signals in Solution: Challenge to Multinuclear Solution NMR
• Introduction of Various Application Examples Obtained by Multi-Purpose TEM (JEM-F200) with Various Attachments
• TEM Sample Preparation using JIB-PS500i and Multi-Purpose FIB-SEM
• msFineANalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with AI Structural Analysis
• He-less Light Element Analysis using a Low-Vacuum Liquid Sample Capsule by X-ray Fluorescence Spectrometry

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