JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Nanoscale Positioning Highly Coherent Spin Defects in Diamond Using JBX-8100FS
    • Development of a Semi-Automated 3D ED/MicroED System and Its Operation as a Shared-Use Facility
    • Structural Analysis of AMorphous Alumina Using Nuclear Magnetic Resonance Spectroscopy
    • High-Resolution STEM Image Acquisition Method for Tilted Specimen Using a New Type of Aberration Corrector
    • Structure Solution of Nano-Crystalline Powder: A YOKOGUSHI Approach of SynergyED, HRMS, NMR, and Computation
    • Toward Full Automation of Scanning Electron Microscopy: Automating Specimen Exchange and Measurement with Neo Action Robo
    • Introduction of In-situ Charge-Discharge Cycle System and Battery Application
    • Expansion of Crystal Orientation Analysis in Entry-Level SEM
    • Development of an Electron Spectroscopy System (f-HSA) and Its Application to High-Speed Spectrum Imaging
    • Development of an Ultra-Low Temperature Solid-State DNP-NMR System Using a Compact Microwave Source
    • Analysis of Metabolites in HeLa Cells Using GCxGC-TOFMS and Unknown Compounds Structure Analysis Software msFineAnalysisAI

JEOL NEWS Magazine (previous issues)

Vol. 57 No. 1, June 2022

• Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
• Accurate Quantification of Qn Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
• Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
• Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
• Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
• New Semi-in-lens SEM JSM-IT800 / Excellent for Semiconductor Device Observation
• Automated TEM Iamella Preparation with JIB-4700F
• Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
• Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
• Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
• Introduction to JEOL Products

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