Electron Optic Documents

We included in this book as many application examples as possible so that they can be used as criteria for judging what causes unsatisfactory image factors (hereinafter referred to as image disturbances). Although this edition does not describe all about image disturbances, it carries application photos to allow you to consider their causes. It is also important to correctly select the optimum observation conditions for various specimens. For instance, this book carries matters which are considered to be useful for using the instrument, such as the accelerating voltage, probe current and working distance (hereinafter abbreviated to WD).

SEM manufacturers can choose different output sizes for their images, making magnification a very deceptive number when comparing SEM micrographs from different SEM manufacturers. Because of this fact, the best way to compare images is to compare the length of the micron bar or field of view.

To build better lithium-ion batteries, scientists are using advanced imaging and analysis tools to fine-tune battery materials.

With the JEOL NeoScope Benchtop SEM, pharmaceutical companies gain a robust and versatile tool for analyzing substance morphology, topography and composition right from within their own laboratory environment. The small footprint and intuitive operation make it easy for any lab personnel to conduct the high resolution imaging and analysis that only an SEM can deliver.

There are a number of applications where scientists and engineers are faced with air or moisture sensitive samples that require imaging and analysis using a scanning electron microscope (SEM). Applications include: components in rechargeable batteries, fuel cells, and catalysts among others. Any exposure to oxygen or moisture in the air can completely alter or destroy the structure of these highly reactive materials. JEOL has built a special air-lock system that can handle the transfer of air-sensitive specimens to be imaged in the SEM without atmospheric exposure.

The ability to increase the probe current for fast microanalysis, while still maintaining a small spot size and small volume of excitation for high resolution, has been the holy grail of microanalysis in SEM. One of the unique features of JEOL’s FE-SEMs is the patented Aperture Angle Control Lens (ACL). This lens automatically optimizes for both high resolution imaging at low probe currents and high spatial resolution X-ray analysis at high probe currents with a seamless transition between the two.

JEOL now offers both simple and advanced automation solutions, giving users the capability to develop protocols that fit their exact imaging needs. When paired with best-in- class AI-driven auto-function technology (auto focus, auto astigmatism correction, auto brightness/contrast), JEOL’s automation solutions are fast, reliable, reproducible, and applicable to a wide range of applications.

Scanning electron microscopes (SEM) coupled with an energy dispersive X-ray detector (EDS) are used extensively to provide insight into a sample’s chemical makeup. This SEM-EDS technique can provide information on the elements present, their relative concentrations and spatial distribution over very small volumes (micron and some instances nanometer scale).

In this study, we combined a newly designed windowless EDS and SXES, and tried to establish a simple method to analyze the chemical state of Si negative electrodes in charged states.

The holy grail of nanoscale analysis with EDS is to quickly analyze any features which can be imaged in the SEM. However, for nanoscale features this is complicated by that fact that X-ray spatial resolution is typically larger than SEM imaging resolution. Figure 1 shows EDS maps from an integrated circuit cross section at 15kV and 6kV using a W SEM and an FE SEM, as well as the approximate X-ray signal depths at those voltages.