Electron Optic Documents

rss

JEOL Resources

Documents of interest in support of your JEOL product

Air Isolated Transfer System

Latest Innovation in our FE SEMs

SMART – POWERFUL – FLEXIBLE

There are a number of applications where scientists and engineers are faced with air or moisture sensitive samples that require imaging and analysis using a scanning electron microscope (SEM). Applications include: components in rechargeable batteries, fuel cells, and catalysts among others. Any exposure to oxygen or moisture in the air can completely alter or destroy the structure of these highly reactive materials. JEOL has built a special air-lock system that can handle the transfer of air-sensitive specimens to be imaged in the SEM without atmospheric exposure.


The sample can be prepared, mounted on the holder, and covered with a cap while inside a glove box. The cap seals and isolates the sample from the environment.


The sample holder (w/cap) is then removed from the glovebox and transferred into the load lock of the SEM. After the airlock is evacuated, the user can open the cap and put the sample into the FE-SEM without air exposure.

Showing 0 Comment



Comments are closed.

Other Resources

The following resources are available concerning Electron Optic related instruments:

  • Image Gallery
    -View a selection of electron images
  • FAQs
    -See answers from questions often asked about our SEM and Surface Analysis instruments
  • Links & Resources
    -View our page of useful and interesting links to various electron microscopy resources
  • Videos
    -View some product presentations of our instruments
  • SEM Theory and SEM Training

Request Technical Documents for JEOL EPMA (Microprobes)

Loading
  • 1
  • 2
  • EPMA documents
  • Contact Info
  • Technical Documentation for JEOL EPMA (Microprobes)