JEOL NEWS Magazine

Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

• Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
• Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
• Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast
  Scanning Transmission Electron Microscopy
• Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
• Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
• Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
• Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
• Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh
  Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
• Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
• Introduction of Newly Developed Electron Probe Micro Analyzers
• High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
  Combined with Large-Volume Injection Technique and Fast-GC Method
• Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
  Laser Desorption Ionization Time-of-Flight Mass Spectrometer
• Introduction of JEOL Products