JEOLink Newsletter

• JEM-120i Wins the Instrument Business Outlook's 2024 Silver Design Award
• Cryo-EM Webinar - Exploring the Range of Electron Microscopes: Resolution, Size and Users
• First U.S. Installation of XtaLAB Synergy-ED
• New FE-SEM: JSM-IT810
• The Battery Show 2024
• IDES TEMPO featured in Science Magazine
• Why Use EDS Analysis for Li-Ion Batteries?

• New CRYO FIB-SEM
• Studying Viruses at the Center for Biologic Imaging at the University of Pittsburgh
• Real-time in situ charge/discharge for Lithium-ion Batteries
• Cryo-EM Webinar and Applications Notes
• Visualizing Elemental Distributions with SEM-EDS Mapping
• New in-situ SEM-Raman Capability

• JEOL Image Contest
• Microscopy at LSSU - Investigating Fresh Water Sponges and Particulate Contamination in Hemp
• Webinar: Visualizing Biomolecules with High-Throughput Single Particle Analysis
• Particle Contamination Inspection System for Battery Materials
• Focus in Pharmaceuticals: NeoScope Benchtop SEM
• Introduction to Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy for Advancing Materials Research
• Featured Papers and Microscopy News

• Happy Holidays from JEOL
• An SEM User's Guide to EDS
• Focus on MXenes, Materials, and Scanning Electron Microscopy
• Introduction to Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy for Advancing Materials Research
• Congratulations to our Image Contest Winners
• JEOL Battery Solutions - Particle Contamination Inspection
• Featured Papers and Microscopy News

• Nobel Prize in Chemistry 2023
• Meet the Newest JEOL SEMs with Extreme Automation!
• JEOL Battery Solutions
• New SPA Milestone
• Changing of the Guard: Field Service Operations

• M&M 2023 - Looking Ahead to a Great Conference
• JEOL Installs Two Cryo-Electron Microscopes at Generate: Biomedicines
• JIB-PS500i FIB-SEM: The Cutting Edge in Preparation, Imaging, & Analysis
• Congratulations to our Image Contest Winners
• Choose the Right SEM for Your Lab
• Air Isolation Microscopy Workflow

• 2023 JEOL Image Contest
• Announcing a New FIB-SEM for Fast, Atomic Resolution STEM Sample Preparation
• JEOL Collaborators renowned for their innovations with JEOL Electron Microscopes
• New CRYO ARM Bibliography
• Microscopy Community Celebrates a Legend: Wil Bigelow Honored at 100th Birthday Party
• Get to Know JEOL de Mexico

• Happy Holidays from JEOL
• Battery Imaging and Analysis webinars
• Field Service Spotlight – Noel Black
• Atomic Magnetism Finally Caught on Camera

• Grand Prize TEM Image 2019
• Grand Prize SEM Image 2019
• IDES Acquisition | Lichen Labs
• Lithium-Ion Batteries Imaging

• JEOL Image Contest 2019
• Introducing the JSM-F100
• 70th Anniversary at M&M 2019
• New CNF E-Beam Article

• JEOL Image Contest 2019
• JEOL Financial Services
• Apollo 17 Lunar Soil Sample
• New Periodic Table App

• Robert Pohorenec Appointed JEOL USA President
• JEOL Image Contest 2019
• Announcing Our New Periodic Table App

• Image Contest Calendar and Winning Images
• Microtrace forensic lab featured in Making a Murderer
• Benchtop SEM

• JEOL Image Contest 2018 - July and August Winners
• M&M 2018 Baltimore
• University of Pennsylvania Singh Center for Nanotechnology

• JEOL Image Contest 2018
• What's New for M&M 2018? See us in Baltimore!
• Publications and Microscopy News

• Grand Opening! UC Irvine Materials Research Institute (IMRI)
• JEOL Center for Nanoscale Solutions
• 1st Int'l Symposium on Advanced Microscopy & Spectroscopy (ISAMS)

• Grand Opening of UC IMRI
• Featured REALab: Howard Hughes Medical Institute
• New IT200 - Seamless Navigation

• Grand Prize Winners - JEOL Image Contest 2017
• Some Thoughts on Low kV
• Geoscience Studies at LSU – The Pet Rock Project

• JEOL 2017 Image Contest - December
• Many More Bacteria Have Electrically Conducting Filaments
• “Carboranyl-cysteine”—Synthesis

• Next-Generation Atomic Resolution TEM
• Cryo-EM: Unveiling Protein Functions
• Lithium Ion Batteries; MALDI Imaging

• Spotlight: Dr. George Abela's Research
• Data from New CryoARM Shows Unprecedented Resolution
• MALDI Imaging

• What's New in Industry-Leading TEM from JEOL
• NEOARM, JEM-F200 "F2", JEM-1400Flash
• Recent Publications and Microscopy News

• New Cryo-EM for Single Particle Analysis and Electron Tomography
• Meet the New IT500 SEM
• World's Fastest Direct Write E-Beam Tool

• NEW IT300HR - We've Just Changed the Rules of the Game!
• Surprising Phase Transition Results in Advanced Materials

• Auger - EPMA - what's in a probe?
• Recent Publications
• 2017 New Year Finance Special

• 2017 Calendar
• JEOL Image Contest Winners 2016

• Failure Analysis with the SEM
• Tech Note: STEM-in-SEM
• UT Dallas Engineers Characterize a Novel Transistor